{"title":"用于负载拉力设置的无反射高通滤波器：无反射高通滤波器提高负载拉力测量的稳定性","authors":"Jongheun Lee, Osman Ceylan, Juseop Lee","doi":"10.1109/mmm.2024.3378614","DOIUrl":null,"url":null,"abstract":"Characterization of devices operating under large signal conditions at nonlinear regions requires specific measurement setups since the output power value, operation efficiency, power gain, and linearity are functions of the source impedance, input signal level, biasing values, and load impedance. Hence, measuring a device’s parameters while varying the source or load impedance (called <italic xmlns:mml=\"http://www.w3.org/1998/Math/MathML\" xmlns:xlink=\"http://www.w3.org/1999/xlink\">source-pull</i> and <italic xmlns:mml=\"http://www.w3.org/1998/Math/MathML\" xmlns:xlink=\"http://www.w3.org/1999/xlink\">load-pull</i>\n, respectively) is essential to evaluate its nonlinear behaviors.","PeriodicalId":55023,"journal":{"name":"IEEE Microwave Magazine","volume":null,"pages":null},"PeriodicalIF":3.7000,"publicationDate":"2024-05-08","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Reflectionless High-Pass Filters for Load-Pull Setups: Reflectionless High-Pass Filters Improve Load Pull Measurement Stability\",\"authors\":\"Jongheun Lee, Osman Ceylan, Juseop Lee\",\"doi\":\"10.1109/mmm.2024.3378614\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Characterization of devices operating under large signal conditions at nonlinear regions requires specific measurement setups since the output power value, operation efficiency, power gain, and linearity are functions of the source impedance, input signal level, biasing values, and load impedance. Hence, measuring a device’s parameters while varying the source or load impedance (called <italic xmlns:mml=\\\"http://www.w3.org/1998/Math/MathML\\\" xmlns:xlink=\\\"http://www.w3.org/1999/xlink\\\">source-pull</i> and <italic xmlns:mml=\\\"http://www.w3.org/1998/Math/MathML\\\" xmlns:xlink=\\\"http://www.w3.org/1999/xlink\\\">load-pull</i>\\n, respectively) is essential to evaluate its nonlinear behaviors.\",\"PeriodicalId\":55023,\"journal\":{\"name\":\"IEEE Microwave Magazine\",\"volume\":null,\"pages\":null},\"PeriodicalIF\":3.7000,\"publicationDate\":\"2024-05-08\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"IEEE Microwave Magazine\",\"FirstCategoryId\":\"94\",\"ListUrlMain\":\"https://doi.org/10.1109/mmm.2024.3378614\",\"RegionNum\":3,\"RegionCategory\":\"计算机科学\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q2\",\"JCRName\":\"ENGINEERING, ELECTRICAL & ELECTRONIC\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Microwave Magazine","FirstCategoryId":"94","ListUrlMain":"https://doi.org/10.1109/mmm.2024.3378614","RegionNum":3,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q2","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
Characterization of devices operating under large signal conditions at nonlinear regions requires specific measurement setups since the output power value, operation efficiency, power gain, and linearity are functions of the source impedance, input signal level, biasing values, and load impedance. Hence, measuring a device’s parameters while varying the source or load impedance (called source-pull and load-pull
, respectively) is essential to evaluate its nonlinear behaviors.
期刊介绍：
IEEE Microwave Magazine includes the current newsletter contents, including the President''s message, committee reports, and conference and meeting schedules and reports, of the IEEE Microwave Theory and Techniques Society. The magazine also publishes reviewed Tutorial and Application articles as well as book reviews and regular columns.
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