Md. Khalid Hossain Shishir, Sumaiya Islam Sadia, Shanawaz Ahmed, Allah Rakha Aidid, Md. Masud Rana, Md. Mehedi Hasan, Sazal Kumar, Raton Kumar Bishwas, Md. Ashraful Alam
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The review highlights the complementary roles of TEM and XRD in comprehensive Ag, Cu and Ti nanocrystalline materials characterization. The crystallographic functional parameters of Ag were 2θ= 38.1° (111), 44.3° (200) and 64.4° (220); for Cu crystal 43.3° (111), 50.4° (200), 74.1° (220), 89.9° (311) and 95.1° (222) and 35.1° (100), 38.4° (002), 40.2° (101), 53.0° (102), 63.0° (103), 70.7° (110), 76.2° (112), 82.3° (201) demonstrated for Ti nanocrystals. The crystallographic predominant plane or Miller indices were also revealed by selected area electron diffraction (SAED) on TEM. The FCC structure of Ag and Cu is shown in larger lattice volumes compared to the HCP structure of Ti and prefer oriented. The degree of crystallinity of Ti, Cu and Ag nanocrystalline materials was observed at 90.0%, 98.0% and 100.0% respectively. 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引用次数: 0
摘要
本统计综述利用透射电子显微镜(TEM)和 X 射线衍射(XRD)分析比较了由银(Ag)、铜(Cu)和钛(Ti)组成的功能纳米晶体的晶体结构。TEM 可提供高分辨率成像,直接观察单个纳米粒子的尺寸、内部形状和结晶度。统计分析可量化这三种晶体纳米材料的晶格参数、晶体结构、尺寸分布、相组成、晶格应变、优先取向和晶格体积的变化。综述强调了 TEM 和 XRD 在全面表征银、铜和钛纳米晶体材料方面的互补作用。银的晶体学功能参数分别为 2θ= 38.1° (111)、44.3° (200) 和 64.4° (220);铜晶体的晶体学功能参数分别为 43.3° (111)、50.4° (200)、74.1° (220)、89.9°(311)和 95.1°(222);钛纳米晶体则为 35.1°(100)、38.4°(002)、40.2°(101)、53.0°(102)、63.0°(103)、70.7°(110)、76.2°(112)和 82.3°(201)。TEM 上的选区电子衍射 (SAED) 也揭示了结晶学上的主要平面或米勒指数。与 Ti 的 HCP 结构相比,Ag 和 Cu 的 FCC 结构显示出更大的晶格体积,并且更倾向于定向。钛、铜和银纳米晶体材料的结晶度分别为 90.0%、98.0% 和 100.0%。这种定量比较为了解这些纳米晶体的结构特性关系提供了宝贵的见解,有助于制定合理的设计策略,优化它们在各种功能应用中的性能。
Transmission Electron Microscopic and X-ray Diffraction Based Study of Crystallographic Bibliography Demonstrated on Silver, Copper and Titanium Nanocrystals: State of the Art Statical Review
This statistical review compares the crystallographic structures of functional nanocrystals composed of silver (Ag), copper (Cu) and titanium (Ti) using transmission electron microscopy (TEM) and X-ray diffraction (XRD) analyses. TEM provides high-resolution imaging to directly visualize individual nanoparticles' size, internal shape and crystallinity. Statistical analysis quantifies variations in lattice parameters, crystal structure, size distributions, phase compositions, lattice strains, preferred orientation and lattice volume of these three crystalline nanomaterials. The review highlights the complementary roles of TEM and XRD in comprehensive Ag, Cu and Ti nanocrystalline materials characterization. The crystallographic functional parameters of Ag were 2θ= 38.1° (111), 44.3° (200) and 64.4° (220); for Cu crystal 43.3° (111), 50.4° (200), 74.1° (220), 89.9° (311) and 95.1° (222) and 35.1° (100), 38.4° (002), 40.2° (101), 53.0° (102), 63.0° (103), 70.7° (110), 76.2° (112), 82.3° (201) demonstrated for Ti nanocrystals. The crystallographic predominant plane or Miller indices were also revealed by selected area electron diffraction (SAED) on TEM. The FCC structure of Ag and Cu is shown in larger lattice volumes compared to the HCP structure of Ti and prefer oriented. The degree of crystallinity of Ti, Cu and Ag nanocrystalline materials was observed at 90.0%, 98.0% and 100.0% respectively. This quantitative comparison provides valuable insights into the structural property relationships in these nanocrystals, enabling rational design strategies for optimizing their performance in various functional applications.