用于放电加工测量的有源屏蔽

{"title":"用于放电加工测量的有源屏蔽","authors":"K. Matsuta, Yasuhiro Masuda, Mototsugu Mihara","doi":"10.1007/s10751-024-01916-y","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":516275,"journal":{"name":"Interactions","volume":"71 9","pages":"1-6"},"PeriodicalIF":0.0000,"publicationDate":"2024-05-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Active shield for EDM measurement\",\"authors\":\"K. Matsuta, Yasuhiro Masuda, Mototsugu Mihara\",\"doi\":\"10.1007/s10751-024-01916-y\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"\",\"PeriodicalId\":516275,\"journal\":{\"name\":\"Interactions\",\"volume\":\"71 9\",\"pages\":\"1-6\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2024-05-03\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Interactions\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1007/s10751-024-01916-y\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Interactions","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1007/s10751-024-01916-y","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}