{"title":"用于电子封装的铜/硅复合材料的微观结构和性能:钨层对硅颗粒的影响","authors":"Zhiyong Cai, Jing Wen, Ri-chu Wang, Yan Feng, Xiang Peng, Xinxing Li, Ziming Li, Zhijie Kang, Xiaodi Zhang","doi":"10.1016/j.jallcom.2024.174847","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":503788,"journal":{"name":"Journal of Alloys and Compounds","volume":"33 2","pages":""},"PeriodicalIF":0.0000,"publicationDate":"2024-05-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Microstructure and properties of Cu/Si composites for electronic packaging: Effect of tungsten layer on silicon particles\",\"authors\":\"Zhiyong Cai, Jing Wen, Ri-chu Wang, Yan Feng, Xiang Peng, Xinxing Li, Ziming Li, Zhijie Kang, Xiaodi Zhang\",\"doi\":\"10.1016/j.jallcom.2024.174847\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"\",\"PeriodicalId\":503788,\"journal\":{\"name\":\"Journal of Alloys and Compounds\",\"volume\":\"33 2\",\"pages\":\"\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2024-05-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Journal of Alloys and Compounds\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1016/j.jallcom.2024.174847\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Journal of Alloys and Compounds","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1016/j.jallcom.2024.174847","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}