通过同步辐射成像和 DIII-D 中 Ar-II 线偏振角测量重建失控电子高原电流曲线

C. Marini, Eric M Hollmann, Shawn Wenjie Tang, J. Herfindal, Daisuke Shiraki, R. Wilcox, D. del-Castillo-Negrete, Minglei Yang, N. Eidietis, M. Hoppe
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摘要

对 DIII-D 中的高电流(Ip = 550 kA)中断后失控电子(RE)高原等离子体进行了电流剖面重建。介绍并比较了两种测量大电流RE高原中RE电流剖面的新方法:利用可见同步辐射(SE)成像定位q=2理性表面,以及测量线积分Ar-II线发射的偏振角。结果发现,在数据不确定性范围内,这两种方法是一致的。对 RE 电流曲线的不同模拟与测量结果进行了比较:发现环形流体 RE 模型在测量不确定性范围内最符合数据。除了引入两种测量 RE 电流曲线的新方法和验证目前的模拟能力之外,这项工作还证明了不稳定性可以在 q = 2 和 q = 1 表面增长,而不一定会导致 RE 最终损耗不稳定性。此外,还介绍了数值模拟,以阐明这些不稳定性对同步辐射的作用。
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Runaway electron plateau current profile reconstruction from synchrotron imaging and Ar-II line polarization angle measurements in DIII-D
Current profile reconstructions are obtained for high current (Ip = 550 kA) post-disruption runaway electron (RE) plateau plasmas in DIII-D. Two novel methods of measuring the RE current profile in high-current RE plateaus are introduced and compared: localization of the q = 2 rational surface using visible synchrotron emission (SE) imaging and the measurement of the polarization angle of line-integrated Ar-II line emission. The two methods are found to be consistent with each other within the data uncertainties. Different simulations of the RE current profile are compared with the measurements: the toroidal fluid RE model is found to best fit the data, within the measurement uncertainties. In addition to introducing two novel methods to measure the RE current profile and validating present simulation capabilities, this work demonstrates that instabilities can grow at q = 2 and q = 1 surfaces without necessarily causing a RE final loss instability. Numerical simulations are also presented to elucidate the role of these instabilities on synchrotron emission.
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