Curvature correction factors for the independent verification of monitor units of electron treatment plans calculated in Eclipse.

Electron beam dosimetry is sensitive to the surface contour of the patient. Over 10% difference between Treatment Planning System (TPS) and independent monitor-unit (IMU) calculations have been reported in the literature. Similar results were observed in our clinic between Radformation ClearCalc IMU and Eclipse TPS electron Monte Carlo (eMC) algorithm (v.16.1). This paper presents data measured under 3D printed spherical and cylindrical phantoms to validate the eMC algorithm in the presence of curved geometries. Measurements were performed with multiple detectors and compared to calculations made in Eclipse for the 6, 9 and 12 MeV electron energies. This data is used to create curvature correction factors (CCFs), defined as the ratio of the detector reading with the curved-surface phantom to a flat phantom at the same depth. The mean difference between the TPS calculated and measured CCFs using the NACP, Diode E, microSilicon, and microDiamond detectors were 1.3, 0.9, 0.7 and 0.7% respectively, with maximum differences of 4.5, 2.3, 1.9, and 1.8% respectively. Applying CCFs to previous failing patient IMU calculations improved agreement to the TPS. CCFs were implemented in our clinic for patient-specific IMU calculations with the assistance of a ESAPI script.