{"title":"渗透测试参考块","authors":"N. V. Delenkovskii, A. B. Gnusin","doi":"10.1134/S1061830924600114","DOIUrl":null,"url":null,"abstract":"<p>Reference specimens for penetrant testing have been developed that allow optical microscope assisted measurements of both the opening width of surface defects and their depth with the simultaneous condition that defect cavities do not extend onto the side faces of the blocks. Experimental data on the dependence of the defect indication areas after their development on their width (0.5–8.5 μm) and depth (40–860 mm) are presented. Using correlation analysis, the statistical significance of the above parameters is demonstrated.</p>","PeriodicalId":764,"journal":{"name":"Russian Journal of Nondestructive Testing","volume":"60 2","pages":"188 - 192"},"PeriodicalIF":0.9000,"publicationDate":"2024-05-29","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Reference Blocks for Penetrant Testing\",\"authors\":\"N. V. Delenkovskii, A. B. Gnusin\",\"doi\":\"10.1134/S1061830924600114\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"<p>Reference specimens for penetrant testing have been developed that allow optical microscope assisted measurements of both the opening width of surface defects and their depth with the simultaneous condition that defect cavities do not extend onto the side faces of the blocks. Experimental data on the dependence of the defect indication areas after their development on their width (0.5–8.5 μm) and depth (40–860 mm) are presented. Using correlation analysis, the statistical significance of the above parameters is demonstrated.</p>\",\"PeriodicalId\":764,\"journal\":{\"name\":\"Russian Journal of Nondestructive Testing\",\"volume\":\"60 2\",\"pages\":\"188 - 192\"},\"PeriodicalIF\":0.9000,\"publicationDate\":\"2024-05-29\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Russian Journal of Nondestructive Testing\",\"FirstCategoryId\":\"88\",\"ListUrlMain\":\"https://link.springer.com/article/10.1134/S1061830924600114\",\"RegionNum\":4,\"RegionCategory\":\"材料科学\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q4\",\"JCRName\":\"MATERIALS SCIENCE, CHARACTERIZATION & TESTING\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Russian Journal of Nondestructive Testing","FirstCategoryId":"88","ListUrlMain":"https://link.springer.com/article/10.1134/S1061830924600114","RegionNum":4,"RegionCategory":"材料科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q4","JCRName":"MATERIALS SCIENCE, CHARACTERIZATION & TESTING","Score":null,"Total":0}
Reference specimens for penetrant testing have been developed that allow optical microscope assisted measurements of both the opening width of surface defects and their depth with the simultaneous condition that defect cavities do not extend onto the side faces of the blocks. Experimental data on the dependence of the defect indication areas after their development on their width (0.5–8.5 μm) and depth (40–860 mm) are presented. Using correlation analysis, the statistical significance of the above parameters is demonstrated.
期刊介绍：
Russian Journal of Nondestructive Testing, a translation of Defectoskopiya, is a publication of the Russian Academy of Sciences. This publication offers current Russian research on the theory and technology of nondestructive testing of materials and components. It describes laboratory and industrial investigations of devices and instrumentation and provides reviews of new equipment developed for series manufacture. Articles cover all physical methods of nondestructive testing, including magnetic and electrical; ultrasonic; X-ray and Y-ray; capillary; liquid (color luminescence), and radio (for materials of low conductivity).
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