从电子病历大数据中提取综合特征,用于死亡率和表型预测

IF 1.6 4区 计算机科学 Q3 ENGINEERING, ELECTRICAL & ELECTRONIC Chinese Journal of Electronics Pub Date : 2024-03-31 DOI:10.23919/cje.2023.00.181
Fei Li;Yiqiang Chen;Yang Gu;Yaowei Wang
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引用次数: 0

摘要

综合电子病历(EMR)大数据的特征并将其用于死亡率和表型预测等特定医疗目的,关键在于自动整合单个医疗事件和整体多变量时间序列特征提取,以及缓解数据不平衡问题。本文提供了一种通用特征提取方法,以减少人工干预并自动处理大规模数据。处理过程使用两个变异自动编码器(VAE)来自动提取单个和整体特征。它通过独特设计的 "比例和稳定 "机制,避免了变分自动编码器(VAE)众所周知的后验崩溃问题,并形成了缓解数据不平衡问题的独特手段。我们使用 MIMIC-III 数据库中的 ICU-STAY 患者数据进行了实验,并与主流的 EMR 时间序列处理方法进行了比较。结果表明,该方法提取了可见的综合特征,缓解了数据不平衡问题,提高了特定预测任务的准确性。
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Extracting Integrated Features of Electronic Medical Records Big Data for Mortality and Phenotype Prediction
The key to synthesizing the features of electronic medical records (EMR) big data and using them for specific medical purposes, such as mortality and phenotype prediction, is to integrate the individual medical event and the overall multivariate time series feature extraction automatically, as well as to alleviate data imbalance problems. This paper provides a general feature extraction method to reduce manual intervention and automatically process large-scale data. The processing uses two variational auto-encoders (VAEs) to automatically extract individual and global features. It avoids the well-known posterior collapse problem of Transformer VAE through a uniquely designed “proportional and stabilizing” mechanism and forms a unique means to alleviate the data imbalance problem. We conducted experiments using ICU-STAY patients' data from the MIMIC-III database and compared them with the mainstream EMR time series processing methods. The results show that the method extracts visible and comprehensive features, alleviates data imbalance problems and improves the accuracy in specific predicting tasks.
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来源期刊
Chinese Journal of Electronics
Chinese Journal of Electronics 工程技术-工程:电子与电气
CiteScore
3.70
自引率
16.70%
发文量
342
审稿时长
12.0 months
期刊介绍: CJE focuses on the emerging fields of electronics, publishing innovative and transformative research papers. Most of the papers published in CJE are from universities and research institutes, presenting their innovative research results. Both theoretical and practical contributions are encouraged, and original research papers reporting novel solutions to the hot topics in electronics are strongly recommended.
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