低幅射电子储存环中的相干同步辐射不稳定性

Sara Dastan, Demin Zhou, Takuya Ishibashi, Emanuel Karantzoulis, Simone Di Mitri, Ryan Lindberg
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引用次数: 0

摘要

高频纵向阻抗远远超出了光束频谱的宽度,会对现代低辐照电子存储环的性能构成威胁,因为它们会为微波不稳定性建立一个相对较低的阈值。在这种环中,相干同步辐射(CSR)是造成这些高频阻抗的主要因素。本文以第四代光源环 Elettra 2.0 和由 $e^+e^-$ 圆对撞机组成的超级 KEKB 低能环为例,对 CSR 对电子环的影响进行了系统研究。我们的研究重新审视了由CSR阻抗驱动的微波不稳定性理论,并将分析扩展到其他高频阻抗,如电阻壁和相干踌躇辐射。通过对上述两个环进行不稳定性分析和数值模拟,该研究探索了高频阻抗的影响及其与真空室不连续产生的宽带阻抗的相互作用。
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Coherent synchrotron radiation instability in low-emittance electron storage rings
Longitudinal impedances at high frequencies, which extend far beyond the width of the beam spectrum, can pose a threat to the performance of modern low-emittance electron storage rings, as they can establish a relatively low threshold for microwave instability. In such rings, coherent synchrotron radiation (CSR) emerges as a prominent contributor to these high-frequency impedances. This paper undertakes a systematic investigation into the effects of CSR on electron rings, utilizing Elettra 2.0, a ring of fourth-generation light sources, and the SuperKEKB low-energy ring, a ring of $e^+e^-$ circular colliders, as illustrative examples. Our work revisits theories of microwave instability driven by CSR impedance, extending the analysis to encompass other high-frequency impedances such as resistive wall and coherent wiggler radiation. Through instability analysis and numerical simulations conducted on the two aforementioned rings, the study explored the impact of high-frequency impedances and their interactions with broadband impedances from discontinuities in vacuum chambers.
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