量子退火与最大卡方匹配问题的基准测试

IF 2.4 Q3 COMPUTER SCIENCE, INTERDISCIPLINARY APPLICATIONS Frontiers in Computer Science Pub Date : 2024-06-05 DOI:10.3389/fcomp.2024.1286057
D. Vert, M. Willsch, Berat Yenilen, Renaud Sirdey, Stéphane Louise, K. Michielsen
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引用次数: 0

摘要

我们对量子退火(QA)与模拟退火(SA)进行了基准测试,重点研究了将问题嵌入 D-Wave 量子退火器的不同拓扑结构所产生的影响。我们研究的一系列问题都是最大明细匹配问题的特别设计实例,这些问题在经典上很容易解决,但对 SA 来说却很困难,而且实验发现,对 QA 来说也不容易。除了使用多个 D-Wave 处理器外,我们还通过数值求解随时间变化的薛定谔方程来模拟 QA 过程。我们发现,嵌入式问题可能比非嵌入式问题困难得多,而且一些参数(如链强度)对找到最优解有很大影响。因此,找到一个好的嵌入和最佳参数值可以大大改善结果。有趣的是,我们发现尽管 SA 成功地解决了非嵌入式问题,但与我们在 D-Wave 量子退火器上所能取得的结果相比,嵌入式版本的 SA 结果却相当糟糕。
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Benchmarking quantum annealing with maximum cardinality matching problems
We benchmark Quantum Annealing (QA) vs. Simulated Annealing (SA) with a focus on the impact of the embedding of problems onto the different topologies of the D-Wave quantum annealers. The series of problems we study are especially designed instances of the maximum cardinality matching problem that are easy to solve classically but difficult for SA and, as found experimentally, not easy for QA either. In addition to using several D-Wave processors, we simulate the QA process by numerically solving the time-dependent Schrödinger equation. We find that the embedded problems can be significantly more difficult than the unembedded problems, and some parameters, such as the chain strength, can be very impactful for finding the optimal solution. Thus, finding a good embedding and optimal parameter values can improve the results considerably. Interestingly, we find that although SA succeeds for the unembedded problems, the SA results obtained for the embedded version scale quite poorly in comparison with what we can achieve on the D-Wave quantum annealers.
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来源期刊
Frontiers in Computer Science
Frontiers in Computer Science COMPUTER SCIENCE, INTERDISCIPLINARY APPLICATIONS-
CiteScore
4.30
自引率
0.00%
发文量
152
审稿时长
13 weeks
期刊最新文献
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