Effect of Low-Temperature Stress on Electrical Impedance Spectroscopy Parameters of Rice Leaves at the Seedling Stage

The aim of this study was to detect the electrochemical characteristics of rice leaves under low-temperature stress. This study uses the electrical impedance graph method and the electrolyte exostosis method under the condition of low-temperature cold case study in the seedling stage of rice leaves, with a normal seedling stage of rice crops grown as controls. The shape of the electrical impedance map of rice leaves under low-temperature stress and its change with the increase of low-temperature stress were studied, and the change trend of electrical impedance map parameters with the increase of low-temperature stress was statistically analyzed. At the same time, the two detection methods are discussed to establish the correlation. The results showed that the electrical impedance pattern was a complete, symmetrical, single half arc with rice leaves subjected to reversible damage. The left side of the arc starts to disappear with an irreversible injury. Rice tended to die when the arc on the right side of the impedance spectrum began to scatter. Moreover, the change in the electrical impedance spectrum was consistent with that of relative conductivity. When the rice was not dead, the extracellular resistance and relaxation time of leaves decreased with the increase of stress degree, and intracellular resistance increased. Indicating the electrical impedance spectroscopy (EIS) can be employed as a nondestructive testing method to detect physiological characteristics of rice leaves under low-temperature stress.