使用 Venn-Abers 预测器对噪声标签进行稳健分类

IF 1 4区 计算机科学 Q4 ENGINEERING, ELECTRICAL & ELECTRONIC Journal of Electronic Imaging Pub Date : 2024-06-01 DOI:10.1117/1.jei.33.3.031210
Ichraq Lemghari, Sylvie Le Hégarat-Mascle, Emanuel Aldea, Jennifer Vandoni
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引用次数: 0

摘要

过去几十年来,深度学习方法的出现在计算机视觉任务中取得了令人瞩目的进步,这主要归功于它们能够提取与当前任务相适应的非线性特征。对于有监督的方法来说,数据标注对于实现高水平性能至关重要;然而,在困难的情况下(如特定缺陷检测、非常规数据注释等),这项任务可能非常繁琐甚至麻烦,以至于专家有时会错误地提供错误的基本真实标签。考虑到分类问题,本文探讨了如何处理数据集中的噪声标签。具体来说,我们首先使用集值标签检测数据集中的噪声样本,然后使用 Venn-Abers 预测器改进其分类。对于两个广泛使用的图像分类数据集(数字 MNIST 和 CIFAR-10)的噪声版本(两类对翻噪声比为 40%),所获得的结果分别达到了 0.99 和 0.90 以上的准确率;对于 CIFAR-10(10 类统一噪声比为 40%),所获得的准确率为 0.87。
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Robust classification with noisy labels using Venn–Abers predictors
The advent of deep learning methods has led to impressive advances in computer vision tasks over the past decades, largely due to their ability to extract non-linear features that are well adapted to the task at hand. For supervised approaches, data labeling is essential to achieve a high level of performance; however, this task can be so fastidious or even troublesome in difficult contexts (e.g., specific defect detection, unconventional data annotations, etc.) that experts can sometimes erroneously provide the wrong ground truth label. Considering classification problems, this paper addresses the issue of handling noisy labels in datasets. Specifically, we first detect the noisy samples of a dataset using set-valued labels and then improve their classification using Venn–Abers predictors. The obtained results reach more than 0.99 and 0.90 accuracy for noisified versions of two widely used image classification datasets, digit MNIST and CIFAR-10 respectively with a 40% two-class pair-flip noise ratio and 0.87 accuracy for CIFAR-10 with 10-class uniform 40% noise ratio.
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来源期刊
Journal of Electronic Imaging
Journal of Electronic Imaging 工程技术-成像科学与照相技术
CiteScore
1.70
自引率
27.30%
发文量
341
审稿时长
4.0 months
期刊介绍: The Journal of Electronic Imaging publishes peer-reviewed papers in all technology areas that make up the field of electronic imaging and are normally considered in the design, engineering, and applications of electronic imaging systems.
期刊最新文献
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