{"title":"通过矩阵补全实现 Hüsler-Reiss 图形模型的统计推断","authors":"Manuel Hentschel, Sebastian Engelke, Johan Segers","doi":"10.1080/01621459.2024.2371978","DOIUrl":null,"url":null,"abstract":"The severity of multivariate extreme events is driven by the dependence between the largest marginal observations. The Hüsler–Reiss distribution is a versatile model for this extremal dependence, a...","PeriodicalId":3,"journal":{"name":"ACS Applied Electronic Materials","volume":null,"pages":null},"PeriodicalIF":4.3000,"publicationDate":"2024-06-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Statistical Inference for Hüsler–Reiss Graphical Models Through Matrix Completions\",\"authors\":\"Manuel Hentschel, Sebastian Engelke, Johan Segers\",\"doi\":\"10.1080/01621459.2024.2371978\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The severity of multivariate extreme events is driven by the dependence between the largest marginal observations. The Hüsler–Reiss distribution is a versatile model for this extremal dependence, a...\",\"PeriodicalId\":3,\"journal\":{\"name\":\"ACS Applied Electronic Materials\",\"volume\":null,\"pages\":null},\"PeriodicalIF\":4.3000,\"publicationDate\":\"2024-06-26\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"ACS Applied Electronic Materials\",\"FirstCategoryId\":\"100\",\"ListUrlMain\":\"https://doi.org/10.1080/01621459.2024.2371978\",\"RegionNum\":3,\"RegionCategory\":\"材料科学\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q1\",\"JCRName\":\"ENGINEERING, ELECTRICAL & ELECTRONIC\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"ACS Applied Electronic Materials","FirstCategoryId":"100","ListUrlMain":"https://doi.org/10.1080/01621459.2024.2371978","RegionNum":3,"RegionCategory":"材料科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q1","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
Statistical Inference for Hüsler–Reiss Graphical Models Through Matrix Completions
The severity of multivariate extreme events is driven by the dependence between the largest marginal observations. The Hüsler–Reiss distribution is a versatile model for this extremal dependence, a...
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