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引用次数: 0
摘要
通过波长色散 X 射线荧光光谱法结合偏最小二乘法（PLS）回归，研究了一种定量测定土壤和沉积物中硫酸盐硫的新方法。通过分析硫光谱线 S-Kα 和 S-Kβ 区域的光谱，对硫酸盐硫进行了定量分析。研究表明，这两个区域光谱的差异可用于定量分析存在其他形式硫的硫酸盐硫。所获得的信息可用于对各种性质物体中的硫形式进行定量表达分析。
Quantitative determination of sulfate sulfur in soils and sediments using the S-Kα and S-Kβ X-ray spectra and PLS regression
A new approach to the quantitative determination of sulfate sulfur in soils and sediments by wavelength-dispersive X-ray fluorescence spectrometry in combination with partial least squares (PLS) regression has been investigated. The quantitative analysis of sulfate sulfur was carried out by analyzing the spectra in the S-Kα and S-Kβ regions of sulfur spectral lines. The study shows that the differences in the spectra in both regions can be used for quantitative analysis of sulfate sulfur in the presence of sulfur in other forms. The obtained information can be used for quantitative express analysis of sulfur forms in objects of various nature.
期刊介绍：
Spectrochimica Acta Part B: Atomic Spectroscopy, is intended for the rapid publication of both original work and reviews in the following fields:
Atomic Emission (AES), Atomic Absorption (AAS) and Atomic Fluorescence (AFS) spectroscopy;
Mass Spectrometry (MS) for inorganic analysis covering Spark Source (SS-MS), Inductively Coupled Plasma (ICP-MS), Glow Discharge (GD-MS), and Secondary Ion Mass Spectrometry (SIMS).
Laser induced atomic spectroscopy for inorganic analysis, including non-linear optical laser spectroscopy, covering Laser Enhanced Ionization (LEI), Laser Induced Fluorescence (LIF), Resonance Ionization Spectroscopy (RIS) and Resonance Ionization Mass Spectrometry (RIMS); Laser Induced Breakdown Spectroscopy (LIBS); Cavity Ringdown Spectroscopy (CRDS), Laser Ablation Inductively Coupled Plasma Atomic Emission Spectroscopy (LA-ICP-AES) and Laser Ablation Inductively Coupled Plasma Mass Spectrometry (LA-ICP-MS).
X-ray spectrometry, X-ray Optics and Microanalysis, including X-ray fluorescence spectrometry (XRF) and related techniques, in particular Total-reflection X-ray Fluorescence Spectrometry (TXRF), and Synchrotron Radiation-excited Total reflection XRF (SR-TXRF).
Manuscripts dealing with (i) fundamentals, (ii) methodology development, (iii)instrumentation, and (iv) applications, can be submitted for publication.
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