通过集合平均深度学习模型检测马铃薯叶片病害并对病害严重程度进行分类

Nishu Chowdhury, Jeenat Sultana, Tanim Rahman, Tanjia Chowdhury, F. Khan, Arpita Chakraborty
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引用次数: 0

摘要

由于作物种类、作物病害症状和环境条件的不同,马铃薯叶部病害很难早期发现。由于这些原因,马铃薯叶部病害很难在早期发现。本研究使用 ResNet50V2 和 DenseNet201 转移学习算法开发了一个用于识别马铃薯叶病的集合模型。在这项工作中,从马铃薯叶病数据集和植物村马铃薯数据集中收集了 5702 张图像。数据集包括有效子目录、测试子目录和训练子目录,图像的采集时间为 5 个历元。通过在每个模型中加入三个更密集的层,然后对模型进行集合,也可以提高叶片分类的性能。建议的集合平均模型能准确、恰当地识别马铃薯叶相。因此,建议的集合模型的准确性达到了完美的精度。第二层,使用 K 均值聚类算法评估疾病的严重程度。为了确定病害的严重程度,该系统检查了早疫病和晚疫病图像中的每个像素。如果超过 50%的像素受损,就会被归类为严重。
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Potato leaf disease detection through ensemble average deep learning model and classifying the disease severity
The varying crop species, symptoms of crop diseases, and environmental conditions make early detection of potato leaf disease difficult. Potato leaf diseases are difficult to identify in their early stages because of these reasons. An ensemble model is developed using the ResNet50V2 and DenseNet201 transfer learning algorithms in this study for identifying potato leaf diseases. For this work, 5,702 images were collected from the potato leaf disease dataset and the Plant Village Potato dataset. The datasets include valid, test, and train subdirectories, and the images are taken on 5 epochs. By including three more dense layers in each model and then ensemble that model, the performance of leaf classification may also be improved. Accurately and appropriately, the suggested ensemble averaging model identifies potato leaf phases. So, the accuracy of the suggested ensemble model is achieved with perfect precision. On the second level, the severity of the disorder is assessed using the K mean clustering algorithm. To determine the disease's severity, this system examines each pixel in the early and late blight images. It will be classified as severe if more than 50% of the pixels are damaged.
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来源期刊
CiteScore
2.90
自引率
0.00%
发文量
782
期刊介绍: The aim of Indonesian Journal of Electrical Engineering and Computer Science (formerly TELKOMNIKA Indonesian Journal of Electrical Engineering) is to publish high-quality articles dedicated to all aspects of the latest outstanding developments in the field of electrical engineering. Its scope encompasses the applications of Telecommunication and Information Technology, Applied Computing and Computer, Instrumentation and Control, Electrical (Power), Electronics Engineering and Informatics which covers, but not limited to, the following scope: Signal Processing[...] Electronics[...] Electrical[...] Telecommunication[...] Instrumentation & Control[...] Computing and Informatics[...]
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