探测器背光和中子暗场图像中其他效应的研究

IF 1.3 4区 工程技术 Q4 CHEMISTRY, ANALYTICAL Instrumentation Science & Technology Pub Date : 2024-07-21 DOI:10.1080/10739149.2024.2380772
Ala’a Al-Falahat, Nikolay Kardjilov, Henning Markötter, Andreas Kupsch, Robin Woracek, Saad Alrwashdeh, Ingo Manke
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引用次数: 0

摘要

中子成像可提供独特的对比机制。为了获得可靠且可重复的衰减系数,我们需要充分了解并描述中子成像的电子和光学特性。
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Investigation of detector backlighting and other effects in neutron darkfield images
Neutron imaging can provide unique contrast mechanisms. In order to yield reliable and reproducible attenuation coefficients for quantification, one needs to fully understand and characterize the e...
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来源期刊
Instrumentation Science & Technology
Instrumentation Science & Technology 工程技术-分析化学
CiteScore
3.50
自引率
0.00%
发文量
45
审稿时长
>12 weeks
期刊介绍: Instrumentation Science & Technology is an internationally acclaimed forum for fast publication of critical, peer reviewed manuscripts dealing with innovative instrument design and applications in chemistry, physics biotechnology and environmental science. Particular attention is given to state-of-the-art developments and their rapid communication to the scientific community. Emphasis is on modern instrumental concepts, though not exclusively, including detectors, sensors, data acquisition and processing, instrument control, chromatography, electrochemistry, spectroscopy of all types, electrophoresis, radiometry, relaxation methods, thermal analysis, physical property measurements, surface physics, membrane technology, microcomputer design, chip-based processes, and more. Readership includes everyone who uses instrumental techniques to conduct their research and development. They are chemists (organic, inorganic, physical, analytical, nuclear, quality control) biochemists, biotechnologists, engineers, and physicists in all of the instrumental disciplines mentioned above, in both the laboratory and chemical production environments. The journal is an important resource of instrument design and applications data.
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