来自 HDX 的具有微小健全性的准线性尺寸 PCP

Mitali Bafna, Dor Minzer, Nikhil Vyas
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引用次数: 0

摘要

我们构建了具有任意小常量稳健性的2查询、准线性大小的概率可检验证明(PCPs),改进了迪努尔具有1-\Omega(1)$稳健性的2查询准线性大小的PCPs。作为一个直接推论,我们得到,在指数时间假设下,对于所有 $\epsilon>0$ 的 3$-SAT 近似算法都无法在 2^{n/\log^C n}$ 的时间内获得 7/8+\epsilon$ 的近似率,其中 $C$ 是一个取决于 $\epsilon$ 的常数。我们的结果建立在巴夫纳、利夫希茨和明泽尔,以及迪克斯坦、迪努尔和卢博茨基最近的一系列独立工作的基础上,这些独立工作表明存在线性大小的直接乘积检验器,且具有较小的健全性。我们证明中的主要新成分是一种技术,它能将给定的 PCP 构造嵌入到规定图上的 PCP 中,前提是后者是一个足够好的高维扩展器下的图。为此,我们使用了容错分布式计算的思想,更准确地说,是使用了从 Dwork、Peleg、Pippenger 和 Upfal(1986 年)的工作开始的几乎无处不在的协议问题文献的思想。我们证明,基于 HDX 的图允许路由协议能够容忍对抗性边缘破坏,这样我们也改进了这一工作领域的技术水平。我们的 PCP 构造需要上述直接乘积检验器的多对数度变体。云志伟在附录中说明了这些变体的存在性和可构造性。
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Quasi-Linear Size PCPs with Small Soundness from HDX
We construct 2-query, quasi-linear sized probabilistically checkable proofs (PCPs) with arbitrarily small constant soundness, improving upon Dinur's 2-query quasi-linear size PCPs with soundness $1-\Omega(1)$. As an immediate corollary, we get that under the exponential time hypothesis, for all $\epsilon >0$ no approximation algorithm for $3$-SAT can obtain an approximation ratio of $7/8+\epsilon$ in time $2^{n/\log^C n}$, where $C$ is a constant depending on $\epsilon$. Our result builds on a recent line of works showing the existence of linear sized direct product testers with small soundness by independent works of Bafna, Lifshitz, and Minzer, and of Dikstein, Dinur, and Lubotzky. The main new ingredient in our proof is a technique that embeds a given PCP construction into a PCP on a prescribed graph, provided that the latter is a graph underlying a sufficiently good high-dimensional expander. Towards this end, we use ideas from fault-tolerant distributed computing, and more precisely from the literature of the almost everywhere agreement problem starting with the work of Dwork, Peleg, Pippenger, and Upfal (1986). We show that graphs underlying HDXs admit routing protocols that are tolerant to adversarial edge corruptions, and in doing so we also improve the state of the art in this line of work. Our PCP construction requires variants of the aforementioned direct product testers with poly-logarithmic degree. The existence and constructability of these variants is shown in an appendix by Zhiwei Yun.
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