{"title":"整合自我解释和操作数据,检测数学学习中的僵局","authors":"Ryosuke Nakamoto, B. Flanagan, Yiling Dai, Taisei Yamauchi, Kyosuke Takami, Hiroaki Ogata","doi":"10.58459/rptel.2025.20019","DOIUrl":null,"url":null,"abstract":"Self-explanation is increasingly recognized as a key factor in learning. Identifying learning impasses, which are significant educational challenges, is also crucial as they can lead to deeper learning experiences. This paper argues that integrating self-explanation with relevant datasets is essential for detecting learning impasses in online mathematics education. To test this idea, we created an evaluative framework using a rubric-based approach tailored for mathematical problem-solving. Our analysis combines various data types, including handwritten responses and digital self-explanations from 93 middle school students. Using hierarchical logistic regression, we examined feature groups such as Self-Explanation Quality, Handwriting Features, and Overall Level of Action. Models based solely on self-explanation achieved a 74.0% accuracy rate, while adding more features increased the final model’s accuracy to 80.06%. This improvement highlights the effectiveness of an integrated approach. The combined model, which merges generated handwriting features counts with self-explanation features, shows the importance of both qualitative and quantitative measures in identifying learning impasses. Our findings suggest that a comprehensive approach, leveraging detailed operational data and rich self-explanation content, can enhance the detection of learning challenges, providing insights for personalized education in online learning environments.","PeriodicalId":3,"journal":{"name":"ACS Applied Electronic Materials","volume":"139 10","pages":""},"PeriodicalIF":4.7000,"publicationDate":"2024-07-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Integrating self-explanation and operational data for impasse detection in mathematical learning\",\"authors\":\"Ryosuke Nakamoto, B. Flanagan, Yiling Dai, Taisei Yamauchi, Kyosuke Takami, Hiroaki Ogata\",\"doi\":\"10.58459/rptel.2025.20019\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Self-explanation is increasingly recognized as a key factor in learning. Identifying learning impasses, which are significant educational challenges, is also crucial as they can lead to deeper learning experiences. This paper argues that integrating self-explanation with relevant datasets is essential for detecting learning impasses in online mathematics education. To test this idea, we created an evaluative framework using a rubric-based approach tailored for mathematical problem-solving. Our analysis combines various data types, including handwritten responses and digital self-explanations from 93 middle school students. Using hierarchical logistic regression, we examined feature groups such as Self-Explanation Quality, Handwriting Features, and Overall Level of Action. Models based solely on self-explanation achieved a 74.0% accuracy rate, while adding more features increased the final model’s accuracy to 80.06%. This improvement highlights the effectiveness of an integrated approach. The combined model, which merges generated handwriting features counts with self-explanation features, shows the importance of both qualitative and quantitative measures in identifying learning impasses. Our findings suggest that a comprehensive approach, leveraging detailed operational data and rich self-explanation content, can enhance the detection of learning challenges, providing insights for personalized education in online learning environments.\",\"PeriodicalId\":3,\"journal\":{\"name\":\"ACS Applied Electronic Materials\",\"volume\":\"139 10\",\"pages\":\"\"},\"PeriodicalIF\":4.7000,\"publicationDate\":\"2024-07-23\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"ACS Applied Electronic Materials\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.58459/rptel.2025.20019\",\"RegionNum\":3,\"RegionCategory\":\"材料科学\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q1\",\"JCRName\":\"ENGINEERING, ELECTRICAL & ELECTRONIC\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"ACS Applied Electronic Materials","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.58459/rptel.2025.20019","RegionNum":3,"RegionCategory":"材料科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q1","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
Integrating self-explanation and operational data for impasse detection in mathematical learning
Self-explanation is increasingly recognized as a key factor in learning. Identifying learning impasses, which are significant educational challenges, is also crucial as they can lead to deeper learning experiences. This paper argues that integrating self-explanation with relevant datasets is essential for detecting learning impasses in online mathematics education. To test this idea, we created an evaluative framework using a rubric-based approach tailored for mathematical problem-solving. Our analysis combines various data types, including handwritten responses and digital self-explanations from 93 middle school students. Using hierarchical logistic regression, we examined feature groups such as Self-Explanation Quality, Handwriting Features, and Overall Level of Action. Models based solely on self-explanation achieved a 74.0% accuracy rate, while adding more features increased the final model’s accuracy to 80.06%. This improvement highlights the effectiveness of an integrated approach. The combined model, which merges generated handwriting features counts with self-explanation features, shows the importance of both qualitative and quantitative measures in identifying learning impasses. Our findings suggest that a comprehensive approach, leveraging detailed operational data and rich self-explanation content, can enhance the detection of learning challenges, providing insights for personalized education in online learning environments.
期刊介绍:
ACS Applied Electronic Materials is an interdisciplinary journal publishing original research covering all aspects of electronic materials. The journal is devoted to reports of new and original experimental and theoretical research of an applied nature that integrate knowledge in the areas of materials science, engineering, optics, physics, and chemistry into important applications of electronic materials. Sample research topics that span the journal's scope are inorganic, organic, ionic and polymeric materials with properties that include conducting, semiconducting, superconducting, insulating, dielectric, magnetic, optoelectronic, piezoelectric, ferroelectric and thermoelectric.
Indexed/Abstracted:
Web of Science SCIE
Scopus
CAS
INSPEC
Portico