具有稳健启动特性的电流模式带隙基准

Bingjie Chen, Xue Liu, Xin’an Wang
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引用次数: 0

摘要

具有稳健启动特性的带隙基准在模拟电路中发挥着重要作用。本文研究了传统的电流模式带隙基准(CMBGR)结构,以及传统结构在启动期间具有多个工作点的问题。本文提出了一种 CMBGR 结构,通过简单的启动电路即可消除所有工作点。本文提出的 CMBGR 采用 180 纳米技术,标称温度系数为 16.05 ppm/°C。电路消耗电流为 6 μA,有效面积为 0.046 mm2。
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A Current-Mode bandgap reference with robust start-up behaviour
Bandgap reference with robust start-up behavior has an important role in analog circuits. In this paper, conventional current-mode bandgap reference (CMBGR) structures are investigated, along with the problem of conventional structures having multiple operating points during start-up. A CMBGR structure that can eliminate all the operating points by a simple start-up circuit is proposed. The CMBGR proposed in this paper utilizes the 180 nm technology and achieves a nominal temperature coefficient of 16.05 ppm/°C. The circuit consumes a current of 6 μA and occupies an effective area of 0.046 mm2.
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