利用 LIBS 图谱研究复杂硫化物矿物集合体中的临界金属 Ge 和 Ga

IF 3.2 2区 化学 Q1 SPECTROSCOPY Spectrochimica Acta Part B: Atomic Spectroscopy Pub Date : 2024-07-28 DOI:10.1016/j.sab.2024.107004
J. Coron , S. Papier , S. Decrée , V. Ferreira , L. Duponchel , J.M. Baele
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引用次数: 0

摘要

利用激光诱导击穿光谱(LIBS)绘图进行元素成像正越来越多地应用于各种材料。在地质材料中,相鉴定和表征(矿物学)对于解决地球科学和采矿业的各种问题至关重要。在这里,我们将激光诱导击穿光谱制图应用于来自刚果民主共和国世界级 Kipushi 矿床的矿石样本,因为这些矿石以其矿物复杂性和经济价值而闻名,尤其是在关键金属(如 Ge 和 Ga)方面具有很高的潜力:样品的矿物学是通过结合两种方法重建的:1)根据对现场出现的矿物种类的了解而选择的 LIBS 地图中的元素共定位;2)应用有趣特征发现者(IFF)算法获得的相关地图。重建的矿物包括黄铜矿、辉铜矿、白云石、闪锌矿、方铅矿、黄铁矿、天锰矿(锌)、雷尼尔矿、钨矿、白钨矿、卡罗莱特矿、五倍子矿以及一系列非硫化物煤矸石矿物(石英、碳酸盐和粘土矿物)。在其他结果中,Ge 和 Ga 分别作为主要元素赋存于雷尼埃岩和五倍子岩中,并作为痕量元素赋存于黄铜矿、辉铜矿和钨矿中(Ge),以及黄铜矿、辉铜矿、闪锌矿和雷尼埃岩中(Ga)。我们特别关注了 417.20 纳米波长处铁对镓的干扰,并将简单的背景校正峰强度与更先进的化学计量方法(MCR-ALS)进行了比较。所有结果都是在花费最少时间和精力的情况下获得的,虽然只是定性结果,但已经提供了有关矿石质地、矿物成分和矿石中痕量元素分布的重要信息。
本文章由计算机程序翻译,如有差异,请以英文原文为准。

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Investigating critical metals Ge and Ga in complex sulphide mineral assemblages using LIBS mapping

Elemental imaging using Laser-Induced Breakdown Spectroscopy (LIBS) mapping is increasingly applied to a wide range of materials. In geomaterials, phase identification and characterization (mineralogy) are crucial for solving a variety of problems in earth sciences and mining industry.

Here we applied LIBS mapping to ore samples from the world-class Kipushi deposit, Democratic Republic of Congo, because these ores are known for their great mineral complexity and economic value, especially for their high potential in critical metals such as Ge and Ga.

The mineralogy of the samples was reconstructed by combining two approaches: 1) element colocalization in LIBS maps that were selected based on the knowledge of occurring mineral species at the site and 2) correlation maps obtained by applying the Interesting Features Finder (IFF) algorithm. Reconstructed minerals include chalcopyrite, bornite, chalcocite, sphalerite, galena, pyrite, tennantite-(Zn), renierite, tungstenite, betekhtinite, carrollite, gallite, and a series of non-sulphide gangue minerals (quartz, carbonate and clay minerals). SEM-EDS was used to confirm the LIBS-derived mineralogy, especially for sub-pixel inclusions.

Among other results, Ge and Ga are hosted as major elements in renierite and gallite, respectively, and also as trace-elements in chalcopyrite, bornite and tungstenite (for Ge), and chalcopyrite, bornite, sphalerite and renierite (for Ga). Particular attention was paid to iron interfering with gallium at 417.20 nm, for which simple background-corrected peak intensities were compared to a more advanced chemometric method (MCR-ALS). All the results were obtained with minimal time and efforts and, while only qualitative in nature, they already provide essential information about ore texture, mineralogical composition and trace-element distribution across the ore.

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来源期刊
CiteScore
6.10
自引率
12.10%
发文量
173
审稿时长
81 days
期刊介绍: Spectrochimica Acta Part B: Atomic Spectroscopy, is intended for the rapid publication of both original work and reviews in the following fields: Atomic Emission (AES), Atomic Absorption (AAS) and Atomic Fluorescence (AFS) spectroscopy; Mass Spectrometry (MS) for inorganic analysis covering Spark Source (SS-MS), Inductively Coupled Plasma (ICP-MS), Glow Discharge (GD-MS), and Secondary Ion Mass Spectrometry (SIMS). Laser induced atomic spectroscopy for inorganic analysis, including non-linear optical laser spectroscopy, covering Laser Enhanced Ionization (LEI), Laser Induced Fluorescence (LIF), Resonance Ionization Spectroscopy (RIS) and Resonance Ionization Mass Spectrometry (RIMS); Laser Induced Breakdown Spectroscopy (LIBS); Cavity Ringdown Spectroscopy (CRDS), Laser Ablation Inductively Coupled Plasma Atomic Emission Spectroscopy (LA-ICP-AES) and Laser Ablation Inductively Coupled Plasma Mass Spectrometry (LA-ICP-MS). X-ray spectrometry, X-ray Optics and Microanalysis, including X-ray fluorescence spectrometry (XRF) and related techniques, in particular Total-reflection X-ray Fluorescence Spectrometry (TXRF), and Synchrotron Radiation-excited Total reflection XRF (SR-TXRF). Manuscripts dealing with (i) fundamentals, (ii) methodology development, (iii)instrumentation, and (iv) applications, can be submitted for publication.
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