Detecting Scattering Centers of Complex Scatterers Through Induced Surface Currents [Em Programmer’s Notebook]

This article presents an accurate and efficient method for determining the locations of scattering centers on a complex 3D scatterer. For a given excitation, a localized integration technique is used to calculate the contribution of each surface mesh element to the scattered field in the specified direction. The contribution of a point is computed exclusively by utilizing the currents induced on the surface of the scatterer. The effect of a given point situated on the surface of the scatterer is quantified by the radiation of the current elements within a predefined volume around that point. The algorithm is efficiently implemented with the aid of parallel computing. Numerical experiments involving radar cross-section reduction (RCSR) and antenna siting on a large platform are performed. The suggested approach demonstrates a superior performance compared to traditional methods, such as 1D range profiling, in terms of both efficiency and accuracy for extracting scattering centers.