用于高功率和微波应用的场板工程 AlN/$$\beta$$ -Ga2O3 MOSHEMT 的射频/模拟和线性度性能

Meenakshi Chauhan, K. Jena, Raghuvir Tomar, Abdul Naim Khan
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摘要

这项研究介绍了一种新颖的 AlN/(beta)-Ga2O3 MOSHEMT 设计,其中包含一个场板,用于增强功率开关应用。该研究通过大量分析,研究了不同场板长度(LFP)对关键器件参数的影响,为优化器件设计铺平了道路。AlN/(\beta\)-Ga2O3 组合在 AlN 界面的高带隙和(ns = 1013 cm-2)二维电子气体的形成的促进下,实现了卓越的直流和射频性能。主要研究结果表明,400 nm 场板的峰值击穿电压为 175 V,突出了其在高压应用中的适用性。输出功率表现出明显的 LFP 依赖性,从 100 nm 时的 10.5 kW 到 400 nm 时的 18.1 kW,展示了该器件在大功率运行方面的潜力。此外,通态漏极电流(ION)在不同的 LFP 下保持稳定。技术计算机辅助设计(TCAD)模拟证明了有效的电场管理,400 纳米场板的峰值达到 8.58 MV/cm,并随着 LFP 的缩短而显著降低。此外,详细分析还探讨了器件的线性性能。这包括跨导、其高阶导数以及重要的线性性能指标(FOM),如 VIP2、VIP3、IIP3 和 IMD3。失真参数(HD2 和 HD3)也显示出动态范围的改善和互调干扰的减少。这些令人鼓舞的结果确立了所提出的带有场板的 AlN/(\beta\)-Ga2O3 MOSHEMT 在要求高击穿电压、大输出功率和优异线性度的功率开关应用中的重要地位。
本文章由计算机程序翻译,如有差异,请以英文原文为准。

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Rf/analog and linearity performance of field-plate engineered AlN/ $$\beta$$ -Ga2O3 MOSHEMT for high power and microwave applications

This work introduces a novel AlN/\(\beta\)-Ga2O3 MOSHEMT design incorporating a field plate for enhanced power switching applications. The study investigates the impact of varying field plate length (LFP) on key device parameters through extensive analysis paving the way for optimized device design. The AlN/\(\beta\)-Ga2O3 combination, facilitated by the high bandgap of \(\beta\)-Ga2O3 and the formation of a significant two-dimensional electron gas, ns = 1013 cm-2 at the AlN interface, leads to exceptional DC and RF performance. Key findings reveal a peak breakdown voltage of 175 V for a 400 nm field plate, highlighting its suitability for high-voltage applications. The output power exhibits a clear LFP dependence, ranging from 10.5 kW at 100 nm to 18.1 kW at 400 nm, showcasing the device’s potential for high-power operation. Additionally, the on-state drain current (ION) remains stable across varying LFP. Technology Computer Aided Design (TCAD) simulations demonstrate effective electric field management with the 400 nm field plate reaching a peak of 8.58 MV/cm and decreasing significantly with shorter LFP. Furthermore, detailed analysis explores the device’s linearity performance. This includes transconductance, its higher-order derivatives, and crucial linearity figures-of-merit (FOMs) like VIP2, VIP3, IIP3, and IMD3. Distortion parameters (HD2 and HD3) also reveal an improved dynamic range and reduced intermodulation interference. These promising results establish the proposed AlN/\(\beta\)-Ga2O3 MOSHEMT with a field plate as a compelling candidate for power switching applications demanding high breakdown voltage, significant output power, and exceptional linearity.

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