利用 TXRF 光谱法对有价值的副产品进行元素分析:粉煤灰和活性炭

IF 3.2 2区 化学 Q1 SPECTROSCOPY Spectrochimica Acta Part B: Atomic Spectroscopy Pub Date : 2024-08-10 DOI:10.1016/j.sab.2024.107017
Amedeo Cinosi , Giacomo Siviero , Zach McCaffrey
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引用次数: 0

摘要

为了确保副产品的环保性和适用性,必须对其化学成分进行测定,并特别关注痕量元素。在这项工作中,通过全反射 X 射线光谱法和不同的样品制备方法,研究了从富碳基质(包括粉煤灰以及椰壳和杏仁壳活性炭)中提取的副产品。根据元素和样品制备的不同,对悬浮、酸消化、固液萃取和灰化的复杂性和检测能力(从 0.01 毫克/千克到 16 毫克/千克不等)进行了评估。考虑到样品中可能存在镓,对标准添加法进行了改动,从而利用镓的内标定量法测定了环境和技术方面的元素,包括 K、Ca、Ti、V、Mn、Cr、Ni、Cu、Zn、Ga、As、Sr、Pb。报告中介绍并讨论了资产、限制和可能的发展。
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Elemental analysis of valuable byproducts by TXRF spectrometry: coal fly ash and activated carbon

In order to ensure that byproducts are environmentally friendly and fit for purpose, their chemical composition must be determined, with special attention to elements at trace level. The large variability in the type of matrices demands a versatile analytical technique, compatible with sample preparation methods allowing both fast composition screenings and accurate quantitative analysis.

In this work, byproducts derived from carbon-rich matrices, including coal fly ash and activated carbon from coconut and almond shells, were investigated by means of total reflection x-ray spectrometry and different sample preparations. Suspension, acid digestion, solid-liquid extraction and ashing were performed and assessed as to their complexity and detection capabilities, ranging from 0.01 mg/kg to 16 mg/kg, depending on the element and sample preparation. The internal standard quantification with gallium, aided by a variation of the standard additions method to take into account its possible presence in the samples, allowed to determine elements of environmental and technological interest, including K, Ca, Ti, V, Mn, Cr, Ni, Cu, Zn, Ga, As, Sr, Pb. Assets, limits and possible developments are presented and discussed.

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来源期刊
CiteScore
6.10
自引率
12.10%
发文量
173
审稿时长
81 days
期刊介绍: Spectrochimica Acta Part B: Atomic Spectroscopy, is intended for the rapid publication of both original work and reviews in the following fields: Atomic Emission (AES), Atomic Absorption (AAS) and Atomic Fluorescence (AFS) spectroscopy; Mass Spectrometry (MS) for inorganic analysis covering Spark Source (SS-MS), Inductively Coupled Plasma (ICP-MS), Glow Discharge (GD-MS), and Secondary Ion Mass Spectrometry (SIMS). Laser induced atomic spectroscopy for inorganic analysis, including non-linear optical laser spectroscopy, covering Laser Enhanced Ionization (LEI), Laser Induced Fluorescence (LIF), Resonance Ionization Spectroscopy (RIS) and Resonance Ionization Mass Spectrometry (RIMS); Laser Induced Breakdown Spectroscopy (LIBS); Cavity Ringdown Spectroscopy (CRDS), Laser Ablation Inductively Coupled Plasma Atomic Emission Spectroscopy (LA-ICP-AES) and Laser Ablation Inductively Coupled Plasma Mass Spectrometry (LA-ICP-MS). X-ray spectrometry, X-ray Optics and Microanalysis, including X-ray fluorescence spectrometry (XRF) and related techniques, in particular Total-reflection X-ray Fluorescence Spectrometry (TXRF), and Synchrotron Radiation-excited Total reflection XRF (SR-TXRF). Manuscripts dealing with (i) fundamentals, (ii) methodology development, (iii)instrumentation, and (iv) applications, can be submitted for publication.
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