{"title":"旋转搅拌过程和循环时间序列","authors":"Rabah Florian Monsef","doi":"10.1109/TEMC.2024.3431687","DOIUrl":null,"url":null,"abstract":"In the context of reverberation chambers, correlations observed in stirring processes are almost always modeled by linear time series (LTS). Although this approach is known to be reasonable for sliding stirrers, it turns out that its relevance has never been discussed for rotating stirrers. For the first time, we propose to use circular time series (CTS) to model rotating stirring processes. This allows one to exhibit operational conditions under which LTS and CTS perform similarly in terms of modeling accuracy and those where CTS should be used instead of LTS; in particular, the number of stirrer positions is shown to play a key role for this choice.","PeriodicalId":55012,"journal":{"name":"IEEE Transactions on Electromagnetic Compatibility","volume":"66 5","pages":"1679-1682"},"PeriodicalIF":2.0000,"publicationDate":"2024-09-05","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Rotating-Stirring Process and Circular Time Series\",\"authors\":\"Rabah Florian Monsef\",\"doi\":\"10.1109/TEMC.2024.3431687\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"In the context of reverberation chambers, correlations observed in stirring processes are almost always modeled by linear time series (LTS). Although this approach is known to be reasonable for sliding stirrers, it turns out that its relevance has never been discussed for rotating stirrers. For the first time, we propose to use circular time series (CTS) to model rotating stirring processes. This allows one to exhibit operational conditions under which LTS and CTS perform similarly in terms of modeling accuracy and those where CTS should be used instead of LTS; in particular, the number of stirrer positions is shown to play a key role for this choice.\",\"PeriodicalId\":55012,\"journal\":{\"name\":\"IEEE Transactions on Electromagnetic Compatibility\",\"volume\":\"66 5\",\"pages\":\"1679-1682\"},\"PeriodicalIF\":2.0000,\"publicationDate\":\"2024-09-05\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"IEEE Transactions on Electromagnetic Compatibility\",\"FirstCategoryId\":\"94\",\"ListUrlMain\":\"https://ieeexplore.ieee.org/document/10666835/\",\"RegionNum\":3,\"RegionCategory\":\"计算机科学\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q3\",\"JCRName\":\"ENGINEERING, ELECTRICAL & ELECTRONIC\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Transactions on Electromagnetic Compatibility","FirstCategoryId":"94","ListUrlMain":"https://ieeexplore.ieee.org/document/10666835/","RegionNum":3,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q3","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
Rotating-Stirring Process and Circular Time Series
In the context of reverberation chambers, correlations observed in stirring processes are almost always modeled by linear time series (LTS). Although this approach is known to be reasonable for sliding stirrers, it turns out that its relevance has never been discussed for rotating stirrers. For the first time, we propose to use circular time series (CTS) to model rotating stirring processes. This allows one to exhibit operational conditions under which LTS and CTS perform similarly in terms of modeling accuracy and those where CTS should be used instead of LTS; in particular, the number of stirrer positions is shown to play a key role for this choice.
期刊介绍:
IEEE Transactions on Electromagnetic Compatibility publishes original and significant contributions related to all disciplines of electromagnetic compatibility (EMC) and relevant methods to predict, assess and prevent electromagnetic interference (EMI) and increase device/product immunity. The scope of the publication includes, but is not limited to Electromagnetic Environments; Interference Control; EMC and EMI Modeling; High Power Electromagnetics; EMC Standards, Methods of EMC Measurements; Computational Electromagnetics and Signal and Power Integrity, as applied or directly related to Electromagnetic Compatibility problems; Transmission Lines; Electrostatic Discharge and Lightning Effects; EMC in Wireless and Optical Technologies; EMC in Printed Circuit Board and System Design.