A. Sarsa , A. Jiménez-Solano , M.S. Dimitrijević , C. Yubero
{"title":"基于与等离子体参数相关的 FFM 模型的 Hα 线精确斯塔克分析函数","authors":"A. Sarsa , A. Jiménez-Solano , M.S. Dimitrijević , C. Yubero","doi":"10.1016/j.sab.2024.107035","DOIUrl":null,"url":null,"abstract":"<div><p>Optical Emission Spectroscopy is a widely used technique for plasma diagnosis, with particular interest in hydrogen atomic emission due to its prevalence in plasmas. However, accurately determining plasma parameters like electron density, electron temperature, and gas temperature starting from the experimental profiles remains a challenge. This paper introduces a comprehensive model for Stark broadening of the Hα line in a wide range of plasma conditions, addressing the limitations of existing analytical expressions for line shapes. The proposed model encompasses the full splitting of the transition into fifteen Lorentzian profiles and electric micro-field fluctuations surrounding the emitting atoms due to collisions with charged particles. Starting from accurate spectral data obtained from realistic computer simulations, fitting parameters of the model, have been obtained by using an optimization method based on a genetic algorithm. The set of parameters of the model are reported for a wide range of plasma conditions. The behavior of these parameters is analyzed to understand their dependence in terms of the electron density and temperature and gas density of the plasma. The model parameters here obtained constitute a useful tool in plasma diagnosis to obtaining the values of the physical parameters of the plasma starting from the experimental profiles.</p></div>","PeriodicalId":21890,"journal":{"name":"Spectrochimica Acta Part B: Atomic Spectroscopy","volume":"221 ","pages":"Article 107035"},"PeriodicalIF":3.2000,"publicationDate":"2024-09-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://www.sciencedirect.com/science/article/pii/S0584854724001794/pdfft?md5=8a98d211110e1b9081fd9af235eb3f95&pid=1-s2.0-S0584854724001794-main.pdf","citationCount":"0","resultStr":"{\"title\":\"Exact stark analytical function for Hα line based on the FFM model related with plasma parameters\",\"authors\":\"A. Sarsa , A. Jiménez-Solano , M.S. Dimitrijević , C. Yubero\",\"doi\":\"10.1016/j.sab.2024.107035\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"<div><p>Optical Emission Spectroscopy is a widely used technique for plasma diagnosis, with particular interest in hydrogen atomic emission due to its prevalence in plasmas. However, accurately determining plasma parameters like electron density, electron temperature, and gas temperature starting from the experimental profiles remains a challenge. This paper introduces a comprehensive model for Stark broadening of the Hα line in a wide range of plasma conditions, addressing the limitations of existing analytical expressions for line shapes. The proposed model encompasses the full splitting of the transition into fifteen Lorentzian profiles and electric micro-field fluctuations surrounding the emitting atoms due to collisions with charged particles. Starting from accurate spectral data obtained from realistic computer simulations, fitting parameters of the model, have been obtained by using an optimization method based on a genetic algorithm. The set of parameters of the model are reported for a wide range of plasma conditions. The behavior of these parameters is analyzed to understand their dependence in terms of the electron density and temperature and gas density of the plasma. The model parameters here obtained constitute a useful tool in plasma diagnosis to obtaining the values of the physical parameters of the plasma starting from the experimental profiles.</p></div>\",\"PeriodicalId\":21890,\"journal\":{\"name\":\"Spectrochimica Acta Part B: Atomic Spectroscopy\",\"volume\":\"221 \",\"pages\":\"Article 107035\"},\"PeriodicalIF\":3.2000,\"publicationDate\":\"2024-09-07\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"https://www.sciencedirect.com/science/article/pii/S0584854724001794/pdfft?md5=8a98d211110e1b9081fd9af235eb3f95&pid=1-s2.0-S0584854724001794-main.pdf\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Spectrochimica Acta Part B: Atomic Spectroscopy\",\"FirstCategoryId\":\"92\",\"ListUrlMain\":\"https://www.sciencedirect.com/science/article/pii/S0584854724001794\",\"RegionNum\":2,\"RegionCategory\":\"化学\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q1\",\"JCRName\":\"SPECTROSCOPY\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Spectrochimica Acta Part B: Atomic Spectroscopy","FirstCategoryId":"92","ListUrlMain":"https://www.sciencedirect.com/science/article/pii/S0584854724001794","RegionNum":2,"RegionCategory":"化学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q1","JCRName":"SPECTROSCOPY","Score":null,"Total":0}
Exact stark analytical function for Hα line based on the FFM model related with plasma parameters
Optical Emission Spectroscopy is a widely used technique for plasma diagnosis, with particular interest in hydrogen atomic emission due to its prevalence in plasmas. However, accurately determining plasma parameters like electron density, electron temperature, and gas temperature starting from the experimental profiles remains a challenge. This paper introduces a comprehensive model for Stark broadening of the Hα line in a wide range of plasma conditions, addressing the limitations of existing analytical expressions for line shapes. The proposed model encompasses the full splitting of the transition into fifteen Lorentzian profiles and electric micro-field fluctuations surrounding the emitting atoms due to collisions with charged particles. Starting from accurate spectral data obtained from realistic computer simulations, fitting parameters of the model, have been obtained by using an optimization method based on a genetic algorithm. The set of parameters of the model are reported for a wide range of plasma conditions. The behavior of these parameters is analyzed to understand their dependence in terms of the electron density and temperature and gas density of the plasma. The model parameters here obtained constitute a useful tool in plasma diagnosis to obtaining the values of the physical parameters of the plasma starting from the experimental profiles.
期刊介绍:
Spectrochimica Acta Part B: Atomic Spectroscopy, is intended for the rapid publication of both original work and reviews in the following fields:
Atomic Emission (AES), Atomic Absorption (AAS) and Atomic Fluorescence (AFS) spectroscopy;
Mass Spectrometry (MS) for inorganic analysis covering Spark Source (SS-MS), Inductively Coupled Plasma (ICP-MS), Glow Discharge (GD-MS), and Secondary Ion Mass Spectrometry (SIMS).
Laser induced atomic spectroscopy for inorganic analysis, including non-linear optical laser spectroscopy, covering Laser Enhanced Ionization (LEI), Laser Induced Fluorescence (LIF), Resonance Ionization Spectroscopy (RIS) and Resonance Ionization Mass Spectrometry (RIMS); Laser Induced Breakdown Spectroscopy (LIBS); Cavity Ringdown Spectroscopy (CRDS), Laser Ablation Inductively Coupled Plasma Atomic Emission Spectroscopy (LA-ICP-AES) and Laser Ablation Inductively Coupled Plasma Mass Spectrometry (LA-ICP-MS).
X-ray spectrometry, X-ray Optics and Microanalysis, including X-ray fluorescence spectrometry (XRF) and related techniques, in particular Total-reflection X-ray Fluorescence Spectrometry (TXRF), and Synchrotron Radiation-excited Total reflection XRF (SR-TXRF).
Manuscripts dealing with (i) fundamentals, (ii) methodology development, (iii)instrumentation, and (iv) applications, can be submitted for publication.