{"title":"利用定量离层仪测量应力场","authors":"S. M. Torres, J. Kimberley, M. J. Hargather","doi":"10.1063/5.0223560","DOIUrl":null,"url":null,"abstract":"Quantitative schlieren analysis is extended here to optically transparent solids in quasi-static and dynamic experiments to measure stress distributions. The quasi-static experiments in polymethyl methacrylate (PMMA) compared refraction angles and stress gradients calculated from schlieren images to the analytical Flamant solution of a line load on a half-space. The quantitative schlieren measurements of the stress field in the thin sample with a load compared well to the analytical solution. The analysis method was then extended to explosive induced shock waves in PMMA. The explosive induced response of PMMA was experimentally studied using high-speed schlieren to visualize the shock propagation in conjunction with Photon Doppler Velocimetry (PDV) to record surface velocity histories. The stress state estimated from the schlieren images was compared to the stress calculated from the PDV measurements. High-speed imaging limitations caused the shock wave to not be fully resolved in the images, but was resolved in the PDV measurement. The stress state behind the shock calculated from the high-speed images followed a similar trend to the stress calculated from the PDV measurements.","PeriodicalId":15088,"journal":{"name":"Journal of Applied Physics","volume":"10 1","pages":""},"PeriodicalIF":2.7000,"publicationDate":"2024-09-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Stress field measurements using quantitative schlieren\",\"authors\":\"S. M. Torres, J. Kimberley, M. J. Hargather\",\"doi\":\"10.1063/5.0223560\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Quantitative schlieren analysis is extended here to optically transparent solids in quasi-static and dynamic experiments to measure stress distributions. The quasi-static experiments in polymethyl methacrylate (PMMA) compared refraction angles and stress gradients calculated from schlieren images to the analytical Flamant solution of a line load on a half-space. The quantitative schlieren measurements of the stress field in the thin sample with a load compared well to the analytical solution. The analysis method was then extended to explosive induced shock waves in PMMA. The explosive induced response of PMMA was experimentally studied using high-speed schlieren to visualize the shock propagation in conjunction with Photon Doppler Velocimetry (PDV) to record surface velocity histories. The stress state estimated from the schlieren images was compared to the stress calculated from the PDV measurements. High-speed imaging limitations caused the shock wave to not be fully resolved in the images, but was resolved in the PDV measurement. The stress state behind the shock calculated from the high-speed images followed a similar trend to the stress calculated from the PDV measurements.\",\"PeriodicalId\":15088,\"journal\":{\"name\":\"Journal of Applied Physics\",\"volume\":\"10 1\",\"pages\":\"\"},\"PeriodicalIF\":2.7000,\"publicationDate\":\"2024-09-03\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Journal of Applied Physics\",\"FirstCategoryId\":\"101\",\"ListUrlMain\":\"https://doi.org/10.1063/5.0223560\",\"RegionNum\":3,\"RegionCategory\":\"物理与天体物理\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q2\",\"JCRName\":\"PHYSICS, APPLIED\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Journal of Applied Physics","FirstCategoryId":"101","ListUrlMain":"https://doi.org/10.1063/5.0223560","RegionNum":3,"RegionCategory":"物理与天体物理","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q2","JCRName":"PHYSICS, APPLIED","Score":null,"Total":0}
Stress field measurements using quantitative schlieren
Quantitative schlieren analysis is extended here to optically transparent solids in quasi-static and dynamic experiments to measure stress distributions. The quasi-static experiments in polymethyl methacrylate (PMMA) compared refraction angles and stress gradients calculated from schlieren images to the analytical Flamant solution of a line load on a half-space. The quantitative schlieren measurements of the stress field in the thin sample with a load compared well to the analytical solution. The analysis method was then extended to explosive induced shock waves in PMMA. The explosive induced response of PMMA was experimentally studied using high-speed schlieren to visualize the shock propagation in conjunction with Photon Doppler Velocimetry (PDV) to record surface velocity histories. The stress state estimated from the schlieren images was compared to the stress calculated from the PDV measurements. High-speed imaging limitations caused the shock wave to not be fully resolved in the images, but was resolved in the PDV measurement. The stress state behind the shock calculated from the high-speed images followed a similar trend to the stress calculated from the PDV measurements.
期刊介绍:
The Journal of Applied Physics (JAP) is an influential international journal publishing significant new experimental and theoretical results of applied physics research.
Topics covered in JAP are diverse and reflect the most current applied physics research, including:
Dielectrics, ferroelectrics, and multiferroics-
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Emerging, interdisciplinary, and other fields of applied physics-
Magnetism, spintronics, and superconductivity-
Organic-Inorganic systems, including organic electronics-
Photonics, plasmonics, photovoltaics, lasers, optical materials, and phenomena-
Physics of devices and sensors-
Physics of materials, including electrical, thermal, mechanical and other properties-
Physics of matter under extreme conditions-
Physics of nanoscale and low-dimensional systems, including atomic and quantum phenomena-
Physics of semiconductors-
Soft matter, fluids, and biophysics-
Thin films, interfaces, and surfaces