{"title":"基于高度差的改进型高度轮廓模型,用于使用 UV 固化油墨的按需滴墨式 3D 打印","authors":"Yumeng Wu, George Chiu","doi":"arxiv-2409.07021","DOIUrl":null,"url":null,"abstract":"This paper proposes an improved height profile model for drop-on-demand 3D\nprinting with UV curable ink. It is extended from a previously validated model\nand computes height profile indirectly from volume and area propagation to\nensure volume conservation. To accommodate 2D patterns using multiple passes,\nvolume change and area change within region of interest are modeled as a\npiecewise function of height difference before drop deposition. Model\ncoefficients are experimentally obtained and validated with bootstrapping of\nexperimental samples. Six different drop patterns are experimentally validated.\nThe RMS height profile errors for 2D patterns from the proposed model are\nconsistently smaller than existing models from literature and are on the same\nlevel as 1D patterns reported in our previous publication.","PeriodicalId":501175,"journal":{"name":"arXiv - EE - Systems and Control","volume":null,"pages":null},"PeriodicalIF":0.0000,"publicationDate":"2024-09-11","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"An Improved Height Difference Based Model of Height Profile for Drop-on-Demand 3D Printing With UV Curable Ink\",\"authors\":\"Yumeng Wu, George Chiu\",\"doi\":\"arxiv-2409.07021\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper proposes an improved height profile model for drop-on-demand 3D\\nprinting with UV curable ink. It is extended from a previously validated model\\nand computes height profile indirectly from volume and area propagation to\\nensure volume conservation. To accommodate 2D patterns using multiple passes,\\nvolume change and area change within region of interest are modeled as a\\npiecewise function of height difference before drop deposition. Model\\ncoefficients are experimentally obtained and validated with bootstrapping of\\nexperimental samples. Six different drop patterns are experimentally validated.\\nThe RMS height profile errors for 2D patterns from the proposed model are\\nconsistently smaller than existing models from literature and are on the same\\nlevel as 1D patterns reported in our previous publication.\",\"PeriodicalId\":501175,\"journal\":{\"name\":\"arXiv - EE - Systems and Control\",\"volume\":null,\"pages\":null},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2024-09-11\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"arXiv - EE - Systems and Control\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/arxiv-2409.07021\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"arXiv - EE - Systems and Control","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/arxiv-2409.07021","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
An Improved Height Difference Based Model of Height Profile for Drop-on-Demand 3D Printing With UV Curable Ink
This paper proposes an improved height profile model for drop-on-demand 3D
printing with UV curable ink. It is extended from a previously validated model
and computes height profile indirectly from volume and area propagation to
ensure volume conservation. To accommodate 2D patterns using multiple passes,
volume change and area change within region of interest are modeled as a
piecewise function of height difference before drop deposition. Model
coefficients are experimentally obtained and validated with bootstrapping of
experimental samples. Six different drop patterns are experimentally validated.
The RMS height profile errors for 2D patterns from the proposed model are
consistently smaller than existing models from literature and are on the same
level as 1D patterns reported in our previous publication.