{"title":"密码算法故障攻击某些参数的最优值测量方法","authors":"Yu. A. Zuev, P. G. Klyucharev","doi":"10.1134/S1990478924020182","DOIUrl":null,"url":null,"abstract":"<p> This paper is devoted to the construction of a time-optimal method for measuring the\nmaximum permissible (critical) value of the supply voltage (as well as other parameters) of the\ndevice on which the cryptographic algorithm is performed. Knowledge of these values is necessary\nfor successful conduct of error injection, as part of a fault attack. The method is based on\ndynamic programming.\n</p>","PeriodicalId":607,"journal":{"name":"Journal of Applied and Industrial Mathematics","volume":"18 2","pages":"371 - 377"},"PeriodicalIF":0.5800,"publicationDate":"2024-08-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"A Method for Optimal Value Measurement\\nof Some Parameters of Fault Attacks\\non Cryptographic Algorithms\",\"authors\":\"Yu. A. Zuev, P. G. Klyucharev\",\"doi\":\"10.1134/S1990478924020182\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"<p> This paper is devoted to the construction of a time-optimal method for measuring the\\nmaximum permissible (critical) value of the supply voltage (as well as other parameters) of the\\ndevice on which the cryptographic algorithm is performed. Knowledge of these values is necessary\\nfor successful conduct of error injection, as part of a fault attack. The method is based on\\ndynamic programming.\\n</p>\",\"PeriodicalId\":607,\"journal\":{\"name\":\"Journal of Applied and Industrial Mathematics\",\"volume\":\"18 2\",\"pages\":\"371 - 377\"},\"PeriodicalIF\":0.5800,\"publicationDate\":\"2024-08-15\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Journal of Applied and Industrial Mathematics\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://link.springer.com/article/10.1134/S1990478924020182\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q3\",\"JCRName\":\"Engineering\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Journal of Applied and Industrial Mathematics","FirstCategoryId":"1085","ListUrlMain":"https://link.springer.com/article/10.1134/S1990478924020182","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q3","JCRName":"Engineering","Score":null,"Total":0}
A Method for Optimal Value Measurement
of Some Parameters of Fault Attacks
on Cryptographic Algorithms
This paper is devoted to the construction of a time-optimal method for measuring the
maximum permissible (critical) value of the supply voltage (as well as other parameters) of the
device on which the cryptographic algorithm is performed. Knowledge of these values is necessary
for successful conduct of error injection, as part of a fault attack. The method is based on
dynamic programming.
期刊介绍：
Journal of Applied and Industrial Mathematics is a journal that publishes original and review articles containing theoretical results and those of interest for applications in various branches of industry. The journal topics include the qualitative theory of differential equations in application to mechanics, physics, chemistry, biology, technical and natural processes; mathematical modeling in mechanics, physics, engineering, chemistry, biology, ecology, medicine, etc.; control theory; discrete optimization; discrete structures and extremum problems; combinatorics; control and reliability of discrete circuits; mathematical programming; mathematical models and methods for making optimal decisions; models of theory of scheduling, location and replacement of equipment; modeling the control processes; development and analysis of algorithms; synthesis and complexity of control systems; automata theory; graph theory; game theory and its applications; coding theory; scheduling theory; and theory of circuits.
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