Yongmu Yang, Peng Hao, Yang Yu, Xin Xu, Cheng Peng, Fei You
{"title":"带温度补偿和宽带直流阻断电容器的 0.01-50 GHz 功率检测器","authors":"Yongmu Yang, Peng Hao, Yang Yu, Xin Xu, Cheng Peng, Fei You","doi":"10.1002/mop.34315","DOIUrl":null,"url":null,"abstract":"<p>This letter presents a 0.01–50-GHz resistive matching power detector implemented in a commercial 0.15-<span></span><math>\n <semantics>\n <mrow>\n <mi>μm</mi>\n </mrow>\n <annotation> $\\mathrm{\\mu m}$</annotation>\n </semantics></math> GaAs pseudomorphic high electron mobility transistor technology. An analytical expression is derived for the voltage responsivity of the detector as a function of temperature. To compensate for the temperature dependence of the detector, bias diode topology and mesa resistor load are employed. For an input power of −20 dBm at 1 GHz, the maximum variation of the detector output voltage is less than 0.5 dB over the temperature from <span></span><math>\n <semantics>\n <mrow>\n <mo>−</mo>\n <mn>55</mn>\n <mo>°</mo>\n </mrow>\n <annotation> $-55^\\circ $</annotation>\n </semantics></math>C to <span></span><math>\n <semantics>\n <mrow>\n <mn>85</mn>\n <mo>°</mo>\n </mrow>\n <annotation> $85^\\circ $</annotation>\n </semantics></math>C. The detector's S11 is less than −8 dB, the dynamic range (DR) is 55 dB, and the maximum voltage responsivity is 700 V/W. An on-chip wideband capacitor with a bent-strip shape is designed for direct current blocking. The detector can be used for wideband power monitoring and power amplifier control loop for its high DR and temperature stability.</p>","PeriodicalId":18562,"journal":{"name":"Microwave and Optical Technology Letters","volume":"66 9","pages":""},"PeriodicalIF":1.0000,"publicationDate":"2024-09-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"A 0.01–50 GHz power detector with temperature compensation and wideband DC-blocking capacitor\",\"authors\":\"Yongmu Yang, Peng Hao, Yang Yu, Xin Xu, Cheng Peng, Fei You\",\"doi\":\"10.1002/mop.34315\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"<p>This letter presents a 0.01–50-GHz resistive matching power detector implemented in a commercial 0.15-<span></span><math>\\n <semantics>\\n <mrow>\\n <mi>μm</mi>\\n </mrow>\\n <annotation> $\\\\mathrm{\\\\mu m}$</annotation>\\n </semantics></math> GaAs pseudomorphic high electron mobility transistor technology. An analytical expression is derived for the voltage responsivity of the detector as a function of temperature. To compensate for the temperature dependence of the detector, bias diode topology and mesa resistor load are employed. For an input power of −20 dBm at 1 GHz, the maximum variation of the detector output voltage is less than 0.5 dB over the temperature from <span></span><math>\\n <semantics>\\n <mrow>\\n <mo>−</mo>\\n <mn>55</mn>\\n <mo>°</mo>\\n </mrow>\\n <annotation> $-55^\\\\circ $</annotation>\\n </semantics></math>C to <span></span><math>\\n <semantics>\\n <mrow>\\n <mn>85</mn>\\n <mo>°</mo>\\n </mrow>\\n <annotation> $85^\\\\circ $</annotation>\\n </semantics></math>C. The detector's S11 is less than −8 dB, the dynamic range (DR) is 55 dB, and the maximum voltage responsivity is 700 V/W. An on-chip wideband capacitor with a bent-strip shape is designed for direct current blocking. The detector can be used for wideband power monitoring and power amplifier control loop for its high DR and temperature stability.</p>\",\"PeriodicalId\":18562,\"journal\":{\"name\":\"Microwave and Optical Technology Letters\",\"volume\":\"66 9\",\"pages\":\"\"},\"PeriodicalIF\":1.0000,\"publicationDate\":\"2024-09-13\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Microwave and Optical Technology Letters\",\"FirstCategoryId\":\"5\",\"ListUrlMain\":\"https://onlinelibrary.wiley.com/doi/10.1002/mop.34315\",\"RegionNum\":4,\"RegionCategory\":\"工程技术\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q4\",\"JCRName\":\"ENGINEERING, ELECTRICAL & ELECTRONIC\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Microwave and Optical Technology Letters","FirstCategoryId":"5","ListUrlMain":"https://onlinelibrary.wiley.com/doi/10.1002/mop.34315","RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q4","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
A 0.01–50 GHz power detector with temperature compensation and wideband DC-blocking capacitor
This letter presents a 0.01–50-GHz resistive matching power detector implemented in a commercial 0.15- GaAs pseudomorphic high electron mobility transistor technology. An analytical expression is derived for the voltage responsivity of the detector as a function of temperature. To compensate for the temperature dependence of the detector, bias diode topology and mesa resistor load are employed. For an input power of −20 dBm at 1 GHz, the maximum variation of the detector output voltage is less than 0.5 dB over the temperature from C to C. The detector's S11 is less than −8 dB, the dynamic range (DR) is 55 dB, and the maximum voltage responsivity is 700 V/W. An on-chip wideband capacitor with a bent-strip shape is designed for direct current blocking. The detector can be used for wideband power monitoring and power amplifier control loop for its high DR and temperature stability.
期刊介绍:
Microwave and Optical Technology Letters provides quick publication (3 to 6 month turnaround) of the most recent findings and achievements in high frequency technology, from RF to optical spectrum. The journal publishes original short papers and letters on theoretical, applied, and system results in the following areas.
- RF, Microwave, and Millimeter Waves
- Antennas and Propagation
- Submillimeter-Wave and Infrared Technology
- Optical Engineering
All papers are subject to peer review before publication