Numerical simulation of electric field enhancement on the exit surface of fused silica induced by particle contamination

Laser damage to optical components induced by particle contamination is one of the bottleneck problems limiting the output energy of high-power laser facilities. Although there are many studies on the modulation of light fields by particle contaminants, most of them focus on near-field calculations. In this paper, the influence of particles on the front surface of fused silica on the electric field enhancement on the exit surface of fused silica is studied. Through the research in this paper, particle contaminants cause the electric field to be enhanced on the exit surface of fused silica. Particle diameter, number of particles, particle shape, and particle material are important factors affecting the electric field enhancement on the exit surface of the optical component. The influence of fused silica particles and metal particles on the light intensity of the optical component exit surface is difficult to determine even through numerical simulation, because it is affected by the particle diameter and shape. The research in this paper helps to understand the mechanism of particle contamination-induced laser damage in fused silica.