超短激光脉冲对钨的烧蚀特性

IF 2.7 3区 物理与天体物理 Q2 PHYSICS, APPLIED Journal of Applied Physics Pub Date : 2024-09-13 DOI:10.1063/5.0222073
Steffen Mittelmann, Jan Riedlinger, Benedikt Buchner, Thomas Schwarz-Selinger, Matej Mayer, Georg Pretzler
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引用次数: 0

摘要

在使用超短激光烧蚀来分析材料成分或进行加工任务时,烧蚀材料如何在相互作用区域前的实体角上分布是一个特别令人感兴趣的问题。我们发现,使用 1014W/cm2 到 1017W/cm2 范围内的 10-fs 以下激光,在真空环境中,烧蚀锥的实体角会随着激光强度的增加而显著减小。为此,我们使用离子束分析法研究了在激光烧蚀锥实心角上排列的硅捕捉板上收集的钨的分布情况。此外,我们还使用了扫描电子显微镜和共聚焦激光扫描显微镜等其他死后工具,以确定钨样品的烧蚀阈值 Fth=468mJ/cm2 。很明显,在检测陨石坑深度和烧蚀锥角时,可以观察到两种与激光强度相关的烧蚀机制。
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Ablation characteristics of tungsten with ultra-short laser pulses
In approaches to analyze material composition or in processing tasks using ultra-short laser ablation, it is of particular interest how ablated materials are distributed across the solid angle in front of the interaction region. We found that with our sub-10-fs laser in the regime from 1014W/cm2 to 1017W/cm2, the solid angle of the ablation cone decreases significantly along with the laser intensity in a vacuum environment. For this observation, we used ion-beam analysis to investigate the distribution of tungsten collected on silicon catcher plates arranged across the solid angle of the laser-ablation cone. Moreover, we used other post-mortem tools, such as scanning electron microscopy and confocal laser scanning microscopy, to determine the ablation threshold of Fth=468mJ/cm2 of our tungsten samples. Here, clearly, two laser intensity-dependent ablation regimes can be observed in the detection of a crater depth and a ablation cone angle.
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来源期刊
Journal of Applied Physics
Journal of Applied Physics 物理-物理:应用
CiteScore
5.40
自引率
9.40%
发文量
1534
审稿时长
2.3 months
期刊介绍: The Journal of Applied Physics (JAP) is an influential international journal publishing significant new experimental and theoretical results of applied physics research. Topics covered in JAP are diverse and reflect the most current applied physics research, including: Dielectrics, ferroelectrics, and multiferroics- Electrical discharges, plasmas, and plasma-surface interactions- Emerging, interdisciplinary, and other fields of applied physics- Magnetism, spintronics, and superconductivity- Organic-Inorganic systems, including organic electronics- Photonics, plasmonics, photovoltaics, lasers, optical materials, and phenomena- Physics of devices and sensors- Physics of materials, including electrical, thermal, mechanical and other properties- Physics of matter under extreme conditions- Physics of nanoscale and low-dimensional systems, including atomic and quantum phenomena- Physics of semiconductors- Soft matter, fluids, and biophysics- Thin films, interfaces, and surfaces
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