具有电压模式相位检测和插值功能的超低电压无偏置电流分数-N$混合 PLL

IF 5.6 1区 工程技术 Q1 ENGINEERING, ELECTRICAL & ELECTRONIC IEEE Journal of Solid-state Circuits Pub Date : 2024-09-20 DOI:10.1109/JSSC.2024.3456566
Liqun Feng;Xuansheng Ji;Longhao Kuang;Qianxian Liao;Su Han;Jiahao Zhao;Woogeun Rhee;Zhihua Wang
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引用次数: 0

摘要

提出了一种不需要偏置电流的超低电压分数n混合锁相环。采用基于占空比的时间交错触发器鉴相器(TI-FFPD)实现高线性度和低参考杂散。提出了一种具有电源免疫电压缩放拓扑结构的无源密集电压模式相位插补器(VPI),用于$\Delta \Sigma $量化噪声(q -噪声)降低,无需增益或线性校准。在28纳米CMOS上实现了由伪差分模拟比例路径和数字积分路径组成的混合锁相环(HPLL)。该HPLL在2.42 ghz输出时表现出607-fsrms的抖动和- 59 dbc的带内分数杂散,在0.5 V电源下消耗0.78 mw的功率,在低压(${V_{\mathrm {DD}}}~{\lt }~0.8$ V)分数n pll中实现了- 245.4 dB的最佳优值(FoMJIT)。
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An Ultra-Low-Voltage Bias-Current-Free Fractional-N Hybrid PLL With Voltage-Mode Phase Detection and Interpolation
This article presents an ultra-low voltage (ULV) fractional-N hybrid phase-locked loop (PLL) without requiring bias current. A time-interleaved flip-flop phase detector (TI-FFPD) with duty-cycle-based phase detection is employed to achieve high linearity and low reference spur. A passive-intensive voltage-mode phase interpolator (VPI) with a supply-immune voltage scaling topology is proposed for $\Delta \Sigma $ quantization noise (Q-noise) reduction without gain or linearity calibration. A hybrid PLL (HPLL) that consists of a pseudo-differential analog proportional path and a digital integral path is implemented in 28-nm CMOS. The HPLL exhibits 607-fsrms jitter and −59-dBc in-band fractional spur at 2.42-GHz output and consumes 0.78-mW power from a 0.5-V supply, achieving the best figure of merit (FoMJIT) of −245.4 dB among low-voltage ( ${V_{\mathrm {DD}}}~{\lt }~0.8$ V) fractional-N PLLs.
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来源期刊
IEEE Journal of Solid-state Circuits
IEEE Journal of Solid-state Circuits 工程技术-工程:电子与电气
CiteScore
11.00
自引率
20.40%
发文量
351
审稿时长
3-6 weeks
期刊介绍: The IEEE Journal of Solid-State Circuits publishes papers each month in the broad area of solid-state circuits with particular emphasis on transistor-level design of integrated circuits. It also provides coverage of topics such as circuits modeling, technology, systems design, layout, and testing that relate directly to IC design. Integrated circuits and VLSI are of principal interest; material related to discrete circuit design is seldom published. Experimental verification is strongly encouraged.
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