在有序系统的小角中子散射中,通过修正的 Porod 分析法突破可获得长度尺度的极限。

IF 6.1 3区 材料科学 Q1 Biochemistry, Genetics and Molecular Biology Journal of Applied Crystallography Pub Date : 2024-08-27 eCollection Date: 2024-10-01 DOI:10.1107/S1600576724007295
Xaver Simon Brems, Sebastian Mühlbauer, Robert Cubitt
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引用次数: 0

摘要

小角中子散射是一种广泛用于研究块状样品中大尺度结构的技术。传统布拉格散射中可获得的最大长度尺度是由最长的可用中子波长和最小的可分辨散射角共同决定的。本文介绍了一种规避这一限制的方法,该方法通过修改将随机分布物体的散射强度与其比表面积联系起来的众所周知的波洛德定律,能够从低q幂律散射中提取更大的长度尺度。研究表明,在高度排列的畴结构的特殊情况下,从修正的 Porod 定律中提取的比表面积可用于确定畴结构的具体长度尺度。该分析方法被用于研究超导体铌的中间混合态中发现的微米大小的畴结构。使用传统的小角中子散射装置,该分析方法可将可获得的长度尺度范围从 1 微米扩展到 40 微米。
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Pushing the limits of accessible length scales via a modified Porod analysis in small-angle neutron scattering on ordered systems.

Small-angle neutron scattering is a widely used technique to study large-scale structures in bulk samples. The largest accessible length scale in conventional Bragg scattering is determined by the combination of the longest available neutron wavelength and smallest resolvable scattering angle. A method is presented that circumvents this limitation and is able to extract larger length scales from the low-q power-law scattering using a modification of the well known Porod law connecting the scattered intensity of randomly distributed objects to their specific surface area. It is shown that in the special case of a highly aligned domain structure the specific surface area extracted from the modified Porod law can be used to determine specific length scales of the domain structure. The analysis method is applied to study the micrometre-sized domain structure found in the intermediate mixed state of the superconductor niobium. The analysis approach allows the range of accessible length scales to be extended from 1 µm to up to 40 µm using a conventional small-angle neutron scattering setup.

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来源期刊
CiteScore
10.00
自引率
3.30%
发文量
178
审稿时长
4.7 months
期刊介绍: Many research topics in condensed matter research, materials science and the life sciences make use of crystallographic methods to study crystalline and non-crystalline matter with neutrons, X-rays and electrons. Articles published in the Journal of Applied Crystallography focus on these methods and their use in identifying structural and diffusion-controlled phase transformations, structure-property relationships, structural changes of defects, interfaces and surfaces, etc. Developments of instrumentation and crystallographic apparatus, theory and interpretation, numerical analysis and other related subjects are also covered. The journal is the primary place where crystallographic computer program information is published.
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