{"title":"用于无数据少镜头语义分割的原型度量分割 Anything 模型","authors":"Zhiyu Jiang;Ye Yuan;Yuan Yuan","doi":"10.1109/LSP.2024.3476208","DOIUrl":null,"url":null,"abstract":"Few-shot semantic segmentation (FSS) is crucial for image interpretation, yet it is constrained by requirements for extensive base data and a narrow focus on foreground-background differentiation. This work introduces Data-free Few-shot Semantic Segmentation (DFSS), a task that requires limited labeled images and forgoes the need for extensive base data, allowing for comprehensive image segmentation. The proposed method utilizes the Segment Anything Model (SAM) for its generalization capabilities. The Prototypical Metric Segment Anything Model is introduced, featuring an initial segmentation phase followed by prototype matching, effectively addressing the learning challenges posed by limited data. To enhance discrimination in multi-class segmentation, the Supervised Prototypical Contrastive Loss (SPCL) is designed to refine prototype features, ensuring intra-class cohesion and inter-class separation. To further accommodate intra-class variability, the Adaptive Prototype Update (APU) strategy dynamically refines prototypes, adapting the model to class heterogeneity. The method's effectiveness is demonstrated through superior performance over existing techniques on the DFSS task, marking a significant advancement in UAV image segmentation.","PeriodicalId":13154,"journal":{"name":"IEEE Signal Processing Letters","volume":"31 ","pages":"2800-2804"},"PeriodicalIF":3.2000,"publicationDate":"2024-10-08","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Prototypical Metric Segment Anything Model for Data-Free Few-Shot Semantic Segmentation\",\"authors\":\"Zhiyu Jiang;Ye Yuan;Yuan Yuan\",\"doi\":\"10.1109/LSP.2024.3476208\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Few-shot semantic segmentation (FSS) is crucial for image interpretation, yet it is constrained by requirements for extensive base data and a narrow focus on foreground-background differentiation. This work introduces Data-free Few-shot Semantic Segmentation (DFSS), a task that requires limited labeled images and forgoes the need for extensive base data, allowing for comprehensive image segmentation. The proposed method utilizes the Segment Anything Model (SAM) for its generalization capabilities. The Prototypical Metric Segment Anything Model is introduced, featuring an initial segmentation phase followed by prototype matching, effectively addressing the learning challenges posed by limited data. To enhance discrimination in multi-class segmentation, the Supervised Prototypical Contrastive Loss (SPCL) is designed to refine prototype features, ensuring intra-class cohesion and inter-class separation. To further accommodate intra-class variability, the Adaptive Prototype Update (APU) strategy dynamically refines prototypes, adapting the model to class heterogeneity. The method's effectiveness is demonstrated through superior performance over existing techniques on the DFSS task, marking a significant advancement in UAV image segmentation.\",\"PeriodicalId\":13154,\"journal\":{\"name\":\"IEEE Signal Processing Letters\",\"volume\":\"31 \",\"pages\":\"2800-2804\"},\"PeriodicalIF\":3.2000,\"publicationDate\":\"2024-10-08\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"IEEE Signal Processing Letters\",\"FirstCategoryId\":\"5\",\"ListUrlMain\":\"https://ieeexplore.ieee.org/document/10707179/\",\"RegionNum\":2,\"RegionCategory\":\"工程技术\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q2\",\"JCRName\":\"ENGINEERING, ELECTRICAL & ELECTRONIC\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Signal Processing Letters","FirstCategoryId":"5","ListUrlMain":"https://ieeexplore.ieee.org/document/10707179/","RegionNum":2,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q2","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
Prototypical Metric Segment Anything Model for Data-Free Few-Shot Semantic Segmentation
Few-shot semantic segmentation (FSS) is crucial for image interpretation, yet it is constrained by requirements for extensive base data and a narrow focus on foreground-background differentiation. This work introduces Data-free Few-shot Semantic Segmentation (DFSS), a task that requires limited labeled images and forgoes the need for extensive base data, allowing for comprehensive image segmentation. The proposed method utilizes the Segment Anything Model (SAM) for its generalization capabilities. The Prototypical Metric Segment Anything Model is introduced, featuring an initial segmentation phase followed by prototype matching, effectively addressing the learning challenges posed by limited data. To enhance discrimination in multi-class segmentation, the Supervised Prototypical Contrastive Loss (SPCL) is designed to refine prototype features, ensuring intra-class cohesion and inter-class separation. To further accommodate intra-class variability, the Adaptive Prototype Update (APU) strategy dynamically refines prototypes, adapting the model to class heterogeneity. The method's effectiveness is demonstrated through superior performance over existing techniques on the DFSS task, marking a significant advancement in UAV image segmentation.
期刊介绍:
The IEEE Signal Processing Letters is a monthly, archival publication designed to provide rapid dissemination of original, cutting-edge ideas and timely, significant contributions in signal, image, speech, language and audio processing. Papers published in the Letters can be presented within one year of their appearance in signal processing conferences such as ICASSP, GlobalSIP and ICIP, and also in several workshop organized by the Signal Processing Society.