由 PscSE 和 SPPFELAN 驱动的钢板质量检测优化

IF 1 4区 工程技术 Q4 ENGINEERING, ELECTRICAL & ELECTRONIC Microwave and Optical Technology Letters Pub Date : 2024-10-20 DOI:10.1002/mop.34360
Sun Shan, Song Wenguang
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引用次数: 0

摘要

在改进型 YOLOv8n 的基础上,提出了一种钢板缺陷检测和识别方法,以解决传统任务的高人力成本和高工作量问题。SPPFELAN 并行处理输入,通过同时执行多个池化操作来提高计算效率。并行特征融合模块 PscSE 采用混合维度 SE 注意机制(scSE),能更好地捕捉全局和通道相关信息,从而提高特征识别能力。EIOU 损失函数解决了 CIOU 损失的长宽比定义不明确的问题,提高了检测精度并加快了收敛速度。结果表明,YOLOv8n-PscSE-SPPFELAN 模型在东北大学钢板数据集上达到了 76.9% [email protected],比原始 YOLOv8n 提高了 4.6%,计算量为 7.7 GFLOPs,减少了资源占用,大大提高了检测速度。
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Optimization of steel plate quality inspection driven by PscSE and SPPFELAN

Based on the improved YOLOv8n, a steel plate defect detection and recognition method is proposed to address the high labor costs and workload of traditional tasks. SPPFELAN processes inputs in parallel to enhance computational efficiency by executing multiple pooling operations simultaneously. The parallel feature fusion module PscSE, using a mixed-dimension SE attention mechanism (scSE), captures global and channel-related information better, improving characterization capability. The EIOU loss function addresses the ambiguous aspect ratio definition of CIOU loss, enhancing detection accuracy and accelerating convergence. Results show the YOLOv8n-PscSE-SPPFELAN model achieves 76.9% [email protected] on the Northeastern University steel plate dataset, a 4.6% improvement over the original YOLOv8n, with a computation amount of 7.7 GFLOPs, reducing resource usage and greatly improving detection speed.

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来源期刊
Microwave and Optical Technology Letters
Microwave and Optical Technology Letters 工程技术-工程:电子与电气
CiteScore
3.40
自引率
20.00%
发文量
371
审稿时长
4.3 months
期刊介绍: Microwave and Optical Technology Letters provides quick publication (3 to 6 month turnaround) of the most recent findings and achievements in high frequency technology, from RF to optical spectrum. The journal publishes original short papers and letters on theoretical, applied, and system results in the following areas. - RF, Microwave, and Millimeter Waves - Antennas and Propagation - Submillimeter-Wave and Infrared Technology - Optical Engineering All papers are subject to peer review before publication
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