电离辐射 X 射线荧光光谱中的衍射峰识别和校正

IF 3.2 2区 化学 Q1 SPECTROSCOPY Spectrochimica Acta Part B: Atomic Spectroscopy Pub Date : 2024-11-01 DOI:10.1016/j.sab.2024.107060
{"title":"电离辐射 X 射线荧光光谱中的衍射峰识别和校正","authors":"","doi":"10.1016/j.sab.2024.107060","DOIUrl":null,"url":null,"abstract":"<div><div>Energy dispersive X-ray fluorescence (EDXRF) spectroscopy is an analytical technique often used to create maps of the elemental chemical composition. The fluorescence signal can be influenced by X-ray diffraction peaks, a phenomenon that can lead to difficulties or errors in interpreting spectral peaks. However, diffraction can also be useful if we successfully separate it from the fluorescence signal. In this paper, we propose different methods to deal with the diffraction peaks by using the signals obtained from a spectrometer equipped with two detectors. These methods were tested on a thin section of a rock sample to show their effectiveness in processing diffraction peaks. Each method showed its ability to deal with the diffraction peaks in a more or less effective way and each has its own limitations. The latter have to be taken into account when analyzing the EDXRF signal, whether in a geological context or in any other context.</div></div>","PeriodicalId":21890,"journal":{"name":"Spectrochimica Acta Part B: Atomic Spectroscopy","volume":null,"pages":null},"PeriodicalIF":3.2000,"publicationDate":"2024-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Diffraction peak identification and correction in EDXRF spectroscopy\",\"authors\":\"\",\"doi\":\"10.1016/j.sab.2024.107060\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"<div><div>Energy dispersive X-ray fluorescence (EDXRF) spectroscopy is an analytical technique often used to create maps of the elemental chemical composition. The fluorescence signal can be influenced by X-ray diffraction peaks, a phenomenon that can lead to difficulties or errors in interpreting spectral peaks. However, diffraction can also be useful if we successfully separate it from the fluorescence signal. In this paper, we propose different methods to deal with the diffraction peaks by using the signals obtained from a spectrometer equipped with two detectors. These methods were tested on a thin section of a rock sample to show their effectiveness in processing diffraction peaks. Each method showed its ability to deal with the diffraction peaks in a more or less effective way and each has its own limitations. The latter have to be taken into account when analyzing the EDXRF signal, whether in a geological context or in any other context.</div></div>\",\"PeriodicalId\":21890,\"journal\":{\"name\":\"Spectrochimica Acta Part B: Atomic Spectroscopy\",\"volume\":null,\"pages\":null},\"PeriodicalIF\":3.2000,\"publicationDate\":\"2024-11-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Spectrochimica Acta Part B: Atomic Spectroscopy\",\"FirstCategoryId\":\"92\",\"ListUrlMain\":\"https://www.sciencedirect.com/science/article/pii/S0584854724002052\",\"RegionNum\":2,\"RegionCategory\":\"化学\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q1\",\"JCRName\":\"SPECTROSCOPY\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Spectrochimica Acta Part B: Atomic Spectroscopy","FirstCategoryId":"92","ListUrlMain":"https://www.sciencedirect.com/science/article/pii/S0584854724002052","RegionNum":2,"RegionCategory":"化学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q1","JCRName":"SPECTROSCOPY","Score":null,"Total":0}
引用次数: 0

摘要

能量色散 X 射线荧光 (EDXRF) 光谱法是一种常用于绘制元素化学成分图的分析技术。荧光信号可能会受到 X 射线衍射峰的影响,这种现象可能会导致光谱峰解释困难或错误。不过,如果我们能成功地将衍射与荧光信号分离,衍射也是有用的。在本文中,我们提出了不同的方法,利用配备两个探测器的光谱仪获得的信号来处理衍射峰。我们在岩石样品的薄片上对这些方法进行了测试,以显示它们在处理衍射峰方面的有效性。每种方法都能或多或少地有效处理衍射峰,而且每种方法都有自己的局限性。在分析电离辐射 X 射线荧光信号时,无论是在地质方面还是在任何其他方面,都必须考虑到后者。
本文章由计算机程序翻译,如有差异,请以英文原文为准。

摘要图片

查看原文
分享 分享
微信好友 朋友圈 QQ好友 复制链接
本刊更多论文
Diffraction peak identification and correction in EDXRF spectroscopy
Energy dispersive X-ray fluorescence (EDXRF) spectroscopy is an analytical technique often used to create maps of the elemental chemical composition. The fluorescence signal can be influenced by X-ray diffraction peaks, a phenomenon that can lead to difficulties or errors in interpreting spectral peaks. However, diffraction can also be useful if we successfully separate it from the fluorescence signal. In this paper, we propose different methods to deal with the diffraction peaks by using the signals obtained from a spectrometer equipped with two detectors. These methods were tested on a thin section of a rock sample to show their effectiveness in processing diffraction peaks. Each method showed its ability to deal with the diffraction peaks in a more or less effective way and each has its own limitations. The latter have to be taken into account when analyzing the EDXRF signal, whether in a geological context or in any other context.
求助全文
通过发布文献求助,成功后即可免费获取论文全文。 去求助
来源期刊
CiteScore
6.10
自引率
12.10%
发文量
173
审稿时长
81 days
期刊介绍: Spectrochimica Acta Part B: Atomic Spectroscopy, is intended for the rapid publication of both original work and reviews in the following fields: Atomic Emission (AES), Atomic Absorption (AAS) and Atomic Fluorescence (AFS) spectroscopy; Mass Spectrometry (MS) for inorganic analysis covering Spark Source (SS-MS), Inductively Coupled Plasma (ICP-MS), Glow Discharge (GD-MS), and Secondary Ion Mass Spectrometry (SIMS). Laser induced atomic spectroscopy for inorganic analysis, including non-linear optical laser spectroscopy, covering Laser Enhanced Ionization (LEI), Laser Induced Fluorescence (LIF), Resonance Ionization Spectroscopy (RIS) and Resonance Ionization Mass Spectrometry (RIMS); Laser Induced Breakdown Spectroscopy (LIBS); Cavity Ringdown Spectroscopy (CRDS), Laser Ablation Inductively Coupled Plasma Atomic Emission Spectroscopy (LA-ICP-AES) and Laser Ablation Inductively Coupled Plasma Mass Spectrometry (LA-ICP-MS). X-ray spectrometry, X-ray Optics and Microanalysis, including X-ray fluorescence spectrometry (XRF) and related techniques, in particular Total-reflection X-ray Fluorescence Spectrometry (TXRF), and Synchrotron Radiation-excited Total reflection XRF (SR-TXRF). Manuscripts dealing with (i) fundamentals, (ii) methodology development, (iii)instrumentation, and (iv) applications, can be submitted for publication.
期刊最新文献
Diffraction peak identification and correction in EDXRF spectroscopy Radical theory of hydride atomization and its significance for trace element analysis Understanding the role of alloying elements Cr, Ni in erosion–corrosion process of nuclear grade austenitic stainless steel 304 L by total reflection X-ray fluorescence A combination of XGBoost and neural network in LIBS spectrum processing for precise determination of critical elements in 620 iron ore samples of various origins Plasma-mediated mercury vapor generation after microwave-induced combustion of fish tissue with detection by atomic absorption spectrometry
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
现在去查看 取消
×
提示
确定
0
微信
客服QQ
Book学术公众号 扫码关注我们
反馈
×
意见反馈
请填写您的意见或建议
请填写您的手机或邮箱
已复制链接
已复制链接
快去分享给好友吧!
我知道了
×
扫码分享
扫码分享
Book学术官方微信
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术
文献互助 智能选刊 最新文献 互助须知 联系我们:info@booksci.cn
Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。
Copyright © 2023 Book学术 All rights reserved.
ghs 京公网安备 11010802042870号 京ICP备2023020795号-1