V. I. Bondarenko, S. S. Rekhviashvili, F. N. Chukhovskii
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引用次数: 0
摘要
在统计高斯噪声背景下检测到硅(111)晶体中库仑型点缺陷的二维 X 射线投影图像时，使用了导向滤波器和具有四阶道别西斯函数的小波滤波器对其进行了数字处理。二维图像滤波的效率是通过计算滤波后和参考（无噪声）二维图像中所有点的平均强度的相对平方差来确定的。对计算出的强度相对均方根偏差的比较表明，所研究的方法效果很好，可有效地用于 X 射线衍射图像的噪声处理，以三维重建晶体结构中的纳米级缺陷。
Computer Diffraction Tomography: A Comparative Analysis of the Use of Guided and Wavelet Filters for Image Processing
Digital processing of 2D X-ray projection images of a Coulomb-type point defect in a Si(111) crystal detected against the statistical Gaussian noise background has been carried out using a guided filter and a wavelet filter with the 4th-order Daubechies function. The efficiency of 2D image filtering has been determined by calculating the relative square deviations of the intensities of the filtered and reference (noise-free) 2D images averaged over all points. A comparison of the calculated relative root-mean-square deviations of the intensities has shown that the investigated methods work quite well and can be effectively used in noise processing of X-ray diffraction images for 3D reconstruction of nanoscale defects in crystal structures.
期刊介绍：
Crystallography Reports is a journal that publishes original articles short communications, and reviews on various aspects of crystallography: diffraction and scattering of X-rays, electrons, and neutrons, determination of crystal structure of inorganic and organic substances, including proteins and other biological substances; UV-VIS and IR spectroscopy; growth, imperfect structure and physical properties of crystals; thin films, liquid crystals, nanomaterials, partially disordered systems, and the methods of studies.
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