采用 40 纳米技术的 100-112-Gb/s 1.6 Vppd PAM-8 发射器与高摆幅 3 $+$ 1 混合 FFE 分路器

{"title":"采用 40 纳米技术的 100-112-Gb/s 1.6 Vppd PAM-8 发射器与高摆幅 3 $+$ 1 混合 FFE 分路器","authors":"Eunji Song, Jeonghyu Yang, Youngmin Oh, Seungwook Hong, Dongjun Lee, Sangwan Lee, Hyunwoo Im, Taeho Shin, Jaeduk Han","doi":"10.1109/jssc.2024.3492061","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":13129,"journal":{"name":"IEEE Journal of Solid-state Circuits","volume":"246 1","pages":""},"PeriodicalIF":4.6000,"publicationDate":"2024-11-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"100–112-Gb/s 1.6-Vppd PAM-8 Transmitters With High-Swing 3 $+$ 1 Hybrid FFE Taps in 40-nm Technology\",\"authors\":\"Eunji Song, Jeonghyu Yang, Youngmin Oh, Seungwook Hong, Dongjun Lee, Sangwan Lee, Hyunwoo Im, Taeho Shin, Jaeduk Han\",\"doi\":\"10.1109/jssc.2024.3492061\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"\",\"PeriodicalId\":13129,\"journal\":{\"name\":\"IEEE Journal of Solid-state Circuits\",\"volume\":\"246 1\",\"pages\":\"\"},\"PeriodicalIF\":4.6000,\"publicationDate\":\"2024-11-14\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"IEEE Journal of Solid-state Circuits\",\"FirstCategoryId\":\"5\",\"ListUrlMain\":\"https://doi.org/10.1109/jssc.2024.3492061\",\"RegionNum\":1,\"RegionCategory\":\"工程技术\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q1\",\"JCRName\":\"ENGINEERING, ELECTRICAL & ELECTRONIC\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Journal of Solid-state Circuits","FirstCategoryId":"5","ListUrlMain":"https://doi.org/10.1109/jssc.2024.3492061","RegionNum":1,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q1","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}