利用数量有限的校准样品考虑全反射 X 射线荧光分析中的光谱干扰:海洋多金属结核案例研究

IF 3.2 2区 化学 Q1 SPECTROSCOPY Spectrochimica Acta Part B: Atomic Spectroscopy Pub Date : 2024-11-05 DOI:10.1016/j.sab.2024.107070
Alena N. Zhilicheva , Galina V. Pashkova , Victor M. Chubarov , Artem S. Maltsev , Dmitry Kirsanov , Vitaly Panchuk
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引用次数: 0

摘要

本文提出了一种新的全反射 X 射线荧光定量分析方法,该方法可用于在标准样品有限的情况下,对具有复杂基质、诱发重叠光谱信号的样品进行定量分析。该方法基于将真实光谱分解为模拟单个元素子光谱的加权和的最小二乘法(LS),并且只需要一个与基质匹配的参考材料样品。海洋多金属结核和结壳具有复杂的矿物基质,并含有高浓度的重叠元素。比较了 LS 分解法、内标法和使用三种标准样品进行线性校准所获得的结果。结果表明,就大多数元素而言,拟议方法和线性校准的性能优于内标法;不过,拟议方法只需要一个标准样品。
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Consideration of spectral interference in total reflection X-ray fluorescence analysis using a limited number of calibration samples: Case study of ocean polymetallic nodules
A novel approach for quantitative analysis in total-reflection X-ray fluorescence (TXRF) which can be employed for the samples with complex matrices inducing overlapping spectral signals in the scenario of limited availability of standard samples is proposed. The approach is based on the least squares (LS) decomposition of real spectra into the weighted sum of simulated individual element subspectra and requires only a single sample of matrix-matched reference material. Oceanic polymetallic nodules and crusts, having complex mineral matrix and containing high concentrations of overlapping elements, were chosen to demonstrate the feasibility of the approach in quantification of 11 elements. The comparison of the results obtained with LS decomposition, internal standard and linear calibration with three standard samples was performed. It was demonstrated that the performance of the proposed approach and of the linear calibration was better than that of internal standard for most of the elements; however, the proposed method requires only a single standard sample.
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来源期刊
CiteScore
6.10
自引率
12.10%
发文量
173
审稿时长
81 days
期刊介绍: Spectrochimica Acta Part B: Atomic Spectroscopy, is intended for the rapid publication of both original work and reviews in the following fields: Atomic Emission (AES), Atomic Absorption (AAS) and Atomic Fluorescence (AFS) spectroscopy; Mass Spectrometry (MS) for inorganic analysis covering Spark Source (SS-MS), Inductively Coupled Plasma (ICP-MS), Glow Discharge (GD-MS), and Secondary Ion Mass Spectrometry (SIMS). Laser induced atomic spectroscopy for inorganic analysis, including non-linear optical laser spectroscopy, covering Laser Enhanced Ionization (LEI), Laser Induced Fluorescence (LIF), Resonance Ionization Spectroscopy (RIS) and Resonance Ionization Mass Spectrometry (RIMS); Laser Induced Breakdown Spectroscopy (LIBS); Cavity Ringdown Spectroscopy (CRDS), Laser Ablation Inductively Coupled Plasma Atomic Emission Spectroscopy (LA-ICP-AES) and Laser Ablation Inductively Coupled Plasma Mass Spectrometry (LA-ICP-MS). X-ray spectrometry, X-ray Optics and Microanalysis, including X-ray fluorescence spectrometry (XRF) and related techniques, in particular Total-reflection X-ray Fluorescence Spectrometry (TXRF), and Synchrotron Radiation-excited Total reflection XRF (SR-TXRF). Manuscripts dealing with (i) fundamentals, (ii) methodology development, (iii)instrumentation, and (iv) applications, can be submitted for publication.
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