Tianxi Yang , Jie Sun , Yiren Chen , Zhibing Yan , Yang Li , Yijian Zhou , Zhonghang Huang , Chang Lin , Qun Yan
{"title":"用于 3175 PPI 有源矩阵微型 LED 显示器的铟凸块的制造和回流焊","authors":"Tianxi Yang , Jie Sun , Yiren Chen , Zhibing Yan , Yang Li , Yijian Zhou , Zhonghang Huang , Chang Lin , Qun Yan","doi":"10.1016/j.displa.2024.102897","DOIUrl":null,"url":null,"abstract":"<div><div>Indium is acknowledged as a preferred material for micro-light-emitting diodes (micro-LEDs) flip-chip bonding within the industry, due to its favorable economic characteristics and low melting point. However, indium bumps fabricated via photolithography and thermal evaporation often exhibit irregular shapes and varying heights, and they readily oxidize in air to form a tightly adhered oxide layer (In<sub>2</sub>O<sub>3</sub>), leading to flip-chip bonding failures and blind pixels. The reflow process can not only remove the oxide layer but also enhance bump uniformity. Nevertheless, literature on indium reflow predominantly focuses on planar substrates, with limited studies on high-resolution micro-LED chips for flip-chip bonding. This paper details the preparation of micro-LED chips with a pixel density (pixel per inch, PPI) of 3175. An indium bump array with a diameter of approximately 5 μm was prepared on the micro-LED chips using thermal evaporation technology. The influence of reflow time and temperature on indium bumps was thoroughly investigated by the formic acid reflow process, revealing that under the conditions of 270 °C and 180 s, the indium bumps with a narrower size distribution could be reflowed into spherical shapes on the micro-LED structure. Furthermore, an inversely proportional relationship was discovered between mesa/metal layer height and indium bump growth, which influenced the reflow effect. Ultimately, micro-LED chips were integrated with si complementary metal–oxide–semiconductor (CMOS) driver chips through flip-chip bonding technology, resulting in the successful functioning of the devices.</div></div>","PeriodicalId":50570,"journal":{"name":"Displays","volume":"86 ","pages":"Article 102897"},"PeriodicalIF":3.7000,"publicationDate":"2024-11-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Fabrication and Reflow of Indium Bumps for Active-Matrix Micro-LED Display of 3175 PPI\",\"authors\":\"Tianxi Yang , Jie Sun , Yiren Chen , Zhibing Yan , Yang Li , Yijian Zhou , Zhonghang Huang , Chang Lin , Qun Yan\",\"doi\":\"10.1016/j.displa.2024.102897\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"<div><div>Indium is acknowledged as a preferred material for micro-light-emitting diodes (micro-LEDs) flip-chip bonding within the industry, due to its favorable economic characteristics and low melting point. However, indium bumps fabricated via photolithography and thermal evaporation often exhibit irregular shapes and varying heights, and they readily oxidize in air to form a tightly adhered oxide layer (In<sub>2</sub>O<sub>3</sub>), leading to flip-chip bonding failures and blind pixels. The reflow process can not only remove the oxide layer but also enhance bump uniformity. Nevertheless, literature on indium reflow predominantly focuses on planar substrates, with limited studies on high-resolution micro-LED chips for flip-chip bonding. This paper details the preparation of micro-LED chips with a pixel density (pixel per inch, PPI) of 3175. An indium bump array with a diameter of approximately 5 μm was prepared on the micro-LED chips using thermal evaporation technology. The influence of reflow time and temperature on indium bumps was thoroughly investigated by the formic acid reflow process, revealing that under the conditions of 270 °C and 180 s, the indium bumps with a narrower size distribution could be reflowed into spherical shapes on the micro-LED structure. Furthermore, an inversely proportional relationship was discovered between mesa/metal layer height and indium bump growth, which influenced the reflow effect. Ultimately, micro-LED chips were integrated with si complementary metal–oxide–semiconductor (CMOS) driver chips through flip-chip bonding technology, resulting in the successful functioning of the devices.</div></div>\",\"PeriodicalId\":50570,\"journal\":{\"name\":\"Displays\",\"volume\":\"86 \",\"pages\":\"Article 102897\"},\"PeriodicalIF\":3.7000,\"publicationDate\":\"2024-11-23\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Displays\",\"FirstCategoryId\":\"5\",\"ListUrlMain\":\"https://www.sciencedirect.com/science/article/pii/S0141938224002610\",\"RegionNum\":2,\"RegionCategory\":\"工程技术\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q1\",\"JCRName\":\"COMPUTER SCIENCE, HARDWARE & ARCHITECTURE\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Displays","FirstCategoryId":"5","ListUrlMain":"https://www.sciencedirect.com/science/article/pii/S0141938224002610","RegionNum":2,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q1","JCRName":"COMPUTER SCIENCE, HARDWARE & ARCHITECTURE","Score":null,"Total":0}
引用次数: 0
摘要
铟因其良好的经济特性和低熔点,被业界公认为微型发光二极管(micro-LED)倒装芯片键合的首选材料。然而,通过光刻法和热蒸发法制造的铟凸块通常形状不规则、高度不一,而且容易在空气中氧化形成紧密附着的氧化层(In2O3),从而导致倒装芯片键合失败和像素盲区。回流工艺不仅能去除氧化层,还能提高凸点的均匀性。然而,有关铟回流焊的文献主要集中在平面基底上,对用于倒装芯片键合的高分辨率微型 LED 芯片的研究有限。本文详细介绍了像素密度(每英寸像素,PPI)为 3175 的微型 LED 芯片的制备方法。采用热蒸发技术在微型 LED 芯片上制备了直径约为 5 μm 的铟凸点阵列。通过甲酸回流工艺深入研究了回流时间和温度对铟凸点的影响,结果表明在 270 °C 和 180 秒的条件下,尺寸分布较窄的铟凸点可以在微型 LED 结构上回流成球形。此外,还发现介质层/金属层高度与铟凸点生长之间存在反比关系,这也影响了回流效果。最终,通过倒装芯片键合技术,微型 LED 芯片与 si 互补金属氧化物半导体(CMOS)驱动芯片实现了集成,并成功运行。
Fabrication and Reflow of Indium Bumps for Active-Matrix Micro-LED Display of 3175 PPI
Indium is acknowledged as a preferred material for micro-light-emitting diodes (micro-LEDs) flip-chip bonding within the industry, due to its favorable economic characteristics and low melting point. However, indium bumps fabricated via photolithography and thermal evaporation often exhibit irregular shapes and varying heights, and they readily oxidize in air to form a tightly adhered oxide layer (In2O3), leading to flip-chip bonding failures and blind pixels. The reflow process can not only remove the oxide layer but also enhance bump uniformity. Nevertheless, literature on indium reflow predominantly focuses on planar substrates, with limited studies on high-resolution micro-LED chips for flip-chip bonding. This paper details the preparation of micro-LED chips with a pixel density (pixel per inch, PPI) of 3175. An indium bump array with a diameter of approximately 5 μm was prepared on the micro-LED chips using thermal evaporation technology. The influence of reflow time and temperature on indium bumps was thoroughly investigated by the formic acid reflow process, revealing that under the conditions of 270 °C and 180 s, the indium bumps with a narrower size distribution could be reflowed into spherical shapes on the micro-LED structure. Furthermore, an inversely proportional relationship was discovered between mesa/metal layer height and indium bump growth, which influenced the reflow effect. Ultimately, micro-LED chips were integrated with si complementary metal–oxide–semiconductor (CMOS) driver chips through flip-chip bonding technology, resulting in the successful functioning of the devices.
期刊介绍:
Displays is the international journal covering the research and development of display technology, its effective presentation and perception of information, and applications and systems including display-human interface.
Technical papers on practical developments in Displays technology provide an effective channel to promote greater understanding and cross-fertilization across the diverse disciplines of the Displays community. Original research papers solving ergonomics issues at the display-human interface advance effective presentation of information. Tutorial papers covering fundamentals intended for display technologies and human factor engineers new to the field will also occasionally featured.