扫描光束同步加速器散射光束线用荧光透射检测的微光束阻挡器。

IF 6.1 3区 材料科学 Q1 Biochemistry, Genetics and Molecular Biology Journal of Applied Crystallography Pub Date : 2024-10-29 eCollection Date: 2024-12-01 DOI:10.1107/S1600576724009129
Henrik Birkedal, Michael Sztucki, Moritz Stammer, Anastasiia Sadetskaia, Manfred C Burghammer, Tilman A Grünewald
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引用次数: 0

摘要

定量x射线衍射方法需要仔细校正样品透射率。虽然这是在最先进的小角度x射线散射(SAXS)、广角x射线散射(WAXS)或同步加速器设施的衍射光束线上的常规任务,但在SAXS/WAXS实验中,在许多x射线纳米探针上使用小的亚毫米波束时,由于波束的发散限制尺寸和通常紧密的几何形状,传输信号不能与SAXS/WAXS同时记录。这对数据质量是有害的,通常唯一的解决方案是用PIN光电二极管作为检测器重新扫描样品以获得传输值。在这篇文章中,我们提出了一个简单而有效的解决方案,以一个小的束阻的形式镶嵌金属靶,以获得最佳的荧光产量。这种荧光可以用高灵敏度雪崩光电二极管检测,并提供线性计数器来确定样品透射。
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A micro-beamstop with transmission detection by fluorescence for scanning-beam synchrotron scattering beamlines.

Quantitative X-ray diffraction approaches require careful correction for sample transmission. Though this is a routine task at state-of-the-art small-angle X-ray scattering (SAXS), wide-angle X-ray scattering (WAXS) or diffraction beamlines at synchrotron facilities, the transmission signal cannot be recorded concurrently with SAXS/WAXS when using the small, sub-millimetre beamstops at many X-ray nanoprobes during SAXS/WAXS experiments due to the divergence-limited size of the beamstop and the generally tight geometry. This is detrimental to the data quality and often the only solution is to re-scan the sample with a PIN photodiode as a detector to obtain transmission values. In this manuscript, we present a simple yet effective solution to this problem in the form of a small beamstop with an inlaid metal target for optimal fluorescence yield. This fluorescence can be detected with a high-sensitivity avalanche photodiode and provides a linear counter to determine the sample transmission.

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来源期刊
CiteScore
10.00
自引率
3.30%
发文量
178
审稿时长
4.7 months
期刊介绍: Many research topics in condensed matter research, materials science and the life sciences make use of crystallographic methods to study crystalline and non-crystalline matter with neutrons, X-rays and electrons. Articles published in the Journal of Applied Crystallography focus on these methods and their use in identifying structural and diffusion-controlled phase transformations, structure-property relationships, structural changes of defects, interfaces and surfaces, etc. Developments of instrumentation and crystallographic apparatus, theory and interpretation, numerical analysis and other related subjects are also covered. The journal is the primary place where crystallographic computer program information is published.
期刊最新文献
Thermal diffuse scattering analysis of Ag2O binary system via X-ray powder diffraction. Top dusted adhesive tape sample preparation method for the X-ray diffraction analysis of small powder sample volumes with the Bragg-Brentano setup. Journal of Applied Crystallography welcomes eight new Co-editors. A new technical solution to the problem of increasing the resolution of X-ray diffraction methods. An extended thermal pressure equation of state for sodium fluoride.
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