基于近红外双梳光谱的痕量C2H2检测

IF 1.2 4区 工程技术 Q4 ENGINEERING, ELECTRICAL & ELECTRONIC Microwave and Optical Technology Letters Pub Date : 2025-01-10 DOI:10.1002/mop.70073
Shuangquan Rong, Xiaocong Sun, Yuqi Yang, Yueting Zhou, Ting Gong, Mengpeng Hu, Qiang Wang, Xuanbing Qiu, Chuanliang Li
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引用次数: 0

摘要

为了实现近红外双梳光谱(DCS)的低浓度测量,本研究提出了一种近红外DCS检测痕量C2H2的方法。采用多通道气体电池延长光路长度,提高了传感器的灵敏度。采用插值法对信号进行后处理,降低噪声,实现更平坦的双梳。通过选取6526.53、6529.17和6531.78 cm−1处的吸收谱线,对传感器的灵敏度和瞬态特性进行了评价,实验曲线用Voigt函数进行了很好的拟合。在C2H2浓度为200 ppm、2.5 h的条件下证实了该体系的稳定性,稳定性优于2.305 × 10−2。Allan方差分析表明,最佳积分时间为597 s,吸光度最低检测限为6.15 × 10−4,浓度最低检测限为350 ppb。另外,9条吸收线的检测具有多峰测量能力,误差范围为0.059% ~ 12.496%。
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A Trace C2H2 Detection Based on Near-Infrared Dual-Comb Spectroscopy

To achieve low-concentration measurement using near-infrared dual-comb spectroscopy (DCS), this study presents a trace C2H2 detection using near-infrared DCS. A multi-pass gas cell is employed to extend the optical path length, improving the sensor's sensitivity. Signal post-processing via interpolation method is applied to reduce noise and achieve a flatter dual-comb. The sensor's sensitivity and transient characteristics are evaluated by selecting absorption lines at 6526.53, 6529.17, and 6531.78 cm−1, with the experimental profile being well-fitted by a Voigt function. The stability of the system is confirmed with a C2H2 concentration of 200 ppm over a 2.5 h observation period, showing a stability better than 2.305 × 10−2. Allan variance analysis indicates an optimal integration time of 597 s, yielding a minimum detection limit of 6.15 × 10−4 for absorbance and 350 ppb for concentration. Additionally, the detection of nine absorption lines demonstrates the multi-peak measurement capability, with deviations ranging from 0.059% to 12.496%.

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来源期刊
Microwave and Optical Technology Letters
Microwave and Optical Technology Letters 工程技术-工程:电子与电气
CiteScore
3.40
自引率
20.00%
发文量
371
审稿时长
4.3 months
期刊介绍: Microwave and Optical Technology Letters provides quick publication (3 to 6 month turnaround) of the most recent findings and achievements in high frequency technology, from RF to optical spectrum. The journal publishes original short papers and letters on theoretical, applied, and system results in the following areas. - RF, Microwave, and Millimeter Waves - Antennas and Propagation - Submillimeter-Wave and Infrared Technology - Optical Engineering All papers are subject to peer review before publication
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