通过溅射和退火工艺对Pb1-x Sn x Se拓扑晶体绝缘体中的Dirac点位置进行可逆掺杂和微调。

IF 4.6 3区 材料科学 Q2 CHEMISTRY, MULTIDISCIPLINARY Nanoscale Advances Pub Date : 2025-02-10 DOI:10.1039/D4NA00821A
Artem Odobesko, Johannes Jung, Andrzej Szczerbakow, Jędrzej Korczak, Tomasz Story and Matthias Bode
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引用次数: 0

摘要

在这项研究中,我们利用扫描隧道显微镜和光谱学详细介绍了制备原子清洁Pb1-x Sn x Se(001)表面的溅射和退火方法。我们研究了这些过程对表面质量、成分和电子性能的影响。我们的研究结果表明,在250°C和280°C之间的退火温度可以产生光滑的表面,同时保持Pb1-x Sn x Se的拓扑性质。退火温度的精细控制也允许掺杂水平的可逆调谐,使狄拉克点能量相对于费米水平的正或负位移。我们的研究结果突出了这些清洁方法的有效性,并展示了它们在拓扑晶体绝缘体材料中未来研究和应用的潜力。
本文章由计算机程序翻译,如有差异,请以英文原文为准。

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Reversible doping and fine-tuning of the Dirac point position in the topological crystalline insulator Pb1−xSnxSe via sputtering and annealing process†

In this study, we utilize scanning tunneling microscopy and spectroscopy to detail a sputter- and annealing methodology for preparing atomically clean Pb1−xSnxSe(001) surfaces. We examine the impact these processes have on the surface quality, the composition, and the electronic properties. Our findings demonstrate that annealing temperatures between 250 °C and 280 °C produce smooth surfaces while maintaining the topological properties of Pb1−xSnxSe. Fine control of the annealing temperature also allows for a reversible tuning of the doping level, enabling a positive or negative shift of the Dirac point energy with respect to the Fermi level. Our results highlight the effectiveness of these cleaning methods and demonstrate their potential for future research and applications in topological crystalline insulator materials.

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来源期刊
Nanoscale Advances
Nanoscale Advances Multiple-
CiteScore
8.00
自引率
2.10%
发文量
461
审稿时长
9 weeks
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