[一种测定同一物体表面变化的电子显微镜方法]。

{"title":"[一种测定同一物体表面变化的电子显微镜方法]。","authors":"L ALBERT, H HEINEN","doi":"","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":78868,"journal":{"name":"Zeitschrift fur wissenschaftliche Mikroskopie und mikroskopische Technik","volume":"67 ","pages":"24-7"},"PeriodicalIF":0.0000,"publicationDate":"1965-05-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"[AN ELECTRON MICROSCOPIC METHOD FOR DETERMINING SURFACE CHANGES ON THE SAME OBJECT SITE].\",\"authors\":\"L ALBERT, H HEINEN\",\"doi\":\"\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"\",\"PeriodicalId\":78868,\"journal\":{\"name\":\"Zeitschrift fur wissenschaftliche Mikroskopie und mikroskopische Technik\",\"volume\":\"67 \",\"pages\":\"24-7\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1965-05-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Zeitschrift fur wissenschaftliche Mikroskopie und mikroskopische Technik\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Zeitschrift fur wissenschaftliche Mikroskopie und mikroskopische Technik","FirstCategoryId":"1085","ListUrlMain":"","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}