{"title":"长QT综合征的基因检测。","authors":"","doi":"","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":87148,"journal":{"name":"Technology Evaluation Center Assessment Program. Executive summary","volume":"22 9","pages":"1-5"},"PeriodicalIF":0.0000,"publicationDate":"2008-02-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Genetic testing for long QT syndrome.\",\"authors\":\"\",\"doi\":\"\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"\",\"PeriodicalId\":87148,\"journal\":{\"name\":\"Technology Evaluation Center Assessment Program. Executive summary\",\"volume\":\"22 9\",\"pages\":\"1-5\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2008-02-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Technology Evaluation Center Assessment Program. Executive summary\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Technology Evaluation Center Assessment Program. Executive summary","FirstCategoryId":"1085","ListUrlMain":"","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0