采用Rietveld分析的自动、高通量结构精化方法的发展

IF 4.3 3区 材料科学 Q1 ENGINEERING, ELECTRICAL & ELECTRONIC ACS Applied Electronic Materials Pub Date : 2019-12-16 DOI:10.1021/acscombsci.9b00158
Akihisa Aimi*, Kenjiro Fujimoto
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引用次数: 8

摘要

自动化结构分析技术是加速材料研究的需要。在这项研究中,我们开发了一种算法来自动化Rietveld分析,这是一种使用粉末衍射图来细化晶体结构的方法。该算法的特点是重复生成一组初始值,然后进行一次细化。准确的结果获得没有任何策略的细化顺序,因为通常在人工分析中使用。自动化算法的实现和测试提供了与人工分析相当的拟合结果,即使输入了不准确的结构参数初始值。此外,所开发的自动分析方法比人工分析所需的时间要短得多。所开发的方法可能有助于分析大量的衍射数据,从而积累可以提高材料研究效率的结构数据。
本文章由计算机程序翻译,如有差异,请以英文原文为准。

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Development of an Automatic, High-Throughput Structural Refinement Method Using Rietveld Analysis

Automated structural analysis techniques are required to accelerate materials research. In this study, we developed an algorithm to automate Rietveld analysis, which is a method for crystal structure refinement using powder diffraction patterns. This algorithm features the repeated generation of a set of initial values, followed by one-shot refinement. Accurate results were obtained without any strategy for the sequence of refinement, as is often used in manual analysis. Implementation and testing of the automated algorithm provided fitting results that were comparable to those of manual analysis, even when inaccurate initial values for structural parameters were input. Moreover, the much shorter time was required for the developed automatic analysis method than for manual analysis. The developed method will likely facilitate the analysis of large amounts of diffraction data, allowing the accumulation of structural data that can enhance the efficacy of materials research.

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来源期刊
CiteScore
7.20
自引率
4.30%
发文量
567
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