{"title":"收回:探讨数据服务在智慧医疗高危孕产妇数据健康管理中的应用。","authors":"Scanning","doi":"10.1155/2023/9826840","DOIUrl":null,"url":null,"abstract":"<p><p>[This retracts the article DOI: 10.1155/2022/5957697.].</p>","PeriodicalId":21633,"journal":{"name":"Scanning","volume":"2023 ","pages":"9826840"},"PeriodicalIF":0.0000,"publicationDate":"2023-10-04","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10567476/pdf/","citationCount":"0","resultStr":"{\"title\":\"Retracted: Discuss the Application of Data Services in Data Health Management of High-Risk Pregnant and Lying-In Women in Smart Medical Care.\",\"authors\":\"Scanning\",\"doi\":\"10.1155/2023/9826840\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"<p><p>[This retracts the article DOI: 10.1155/2022/5957697.].</p>\",\"PeriodicalId\":21633,\"journal\":{\"name\":\"Scanning\",\"volume\":\"2023 \",\"pages\":\"9826840\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2023-10-04\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10567476/pdf/\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Scanning\",\"FirstCategoryId\":\"5\",\"ListUrlMain\":\"https://doi.org/10.1155/2023/9826840\",\"RegionNum\":4,\"RegionCategory\":\"工程技术\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"2023/1/1 0:00:00\",\"PubModel\":\"eCollection\",\"JCR\":\"Q3\",\"JCRName\":\"Physics and Astronomy\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Scanning","FirstCategoryId":"5","ListUrlMain":"https://doi.org/10.1155/2023/9826840","RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"2023/1/1 0:00:00","PubModel":"eCollection","JCR":"Q3","JCRName":"Physics and Astronomy","Score":null,"Total":0}
期刊介绍:
Scanning provides an international and interdisciplinary medium for the rapid exchange of information among all scientists interested in scanning electron, scanning probe, and scanning optical microscopies. Areas of specific interest include all aspects of the instrumentation associated with scanning microscopies, correlative microscopy techniques, stereometry, stereology, analytic techniques, and novel applications of the microscopies.