用Scherrer公式、Williamson-Hull图和SEM测定晶粒尺寸

M. Sumadiyasa, I. Manuaba
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引用次数: 9

摘要

采用Scherrer方程和Williamson-Hull曲线法,用XRD技术测定了晶粒尺寸。而使用Image-J软件通过SEM来确定颗粒尺寸。为此,合成了化合物Gd0,95La0.05Ba2Cu3O7-d相的样品。根据计算结果,获得了纳米级的晶粒尺寸,然而,由Scherrer方程和Scherrer Modified得到的晶粒尺寸不同,即63.1675nm和67.0005nm。直接和修正的scherrer方程的晶粒尺寸计算结果与Williamson-Hull曲线法(973040nm)的结果不同。同时,Williamson-Hull曲线法和SEM的结果显示几乎相同的值(98.7297nm)。
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Determining Crystallite Size Using Scherrer Formula, Williamson-Hull Plot, and Particle Size with SEM
It has been determined the crystallite size by XRD technique using Scherrer equation and Williamson-Hull Plot method. While the particle size is determined by SEM using Image-J software. For this purpose, synthesized samples of compound Gd0,95La0.05Ba2Cu3O7-d phase. From the calculation results, obtained the crystallite size in nanometers order, however the crystallite size resulting from the Scherrer equations and Scherrer Modified is different, i.e. 63.1675 nm and 67.0005 nm.  The results of the crystallite size calculation by the scherrer equation directly and modified differed from that of the Williamson-Hull Plot method (97,3040 nm). Meanwhile, the results of the Williamson-Hull Plot methods and SEM show almost the same value (98.7297nm).
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