改进的无铅Sn-Bi合金安装技术用于锆石离子探针U-Pb分析

IF 3.4 2区 化学 Q1 SPECTROSCOPY Atomic Spectroscopy Pub Date : 2022-06-10 DOI:10.46770/as.2022.065
Sen Hu
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引用次数: 0

摘要

锆石是一种常见的富铀辅助矿物,存在于地球和地外岩石中,是揭示地球和其他行星上发生的地质事件的时间和地球化学线索的重要工具。在过去的三年中,通过采用Sn-Bi合金作为安装材料的新型样品制备方法,锆英石含水量分析取得了进展。在这里,我们提出了一种改进的无铅Sn-Bi合金材料用于安装样品,并研究了合金安装是否适合原位U-Pb测年。次级离子质谱(SIMS) U-Pb定年结果表明,合金座中锆石标准品中204 Pb的计数率小于0.01 cps/nA,计算的锆石标准品U-Pb和Pb-Pb年龄在分析不确定度范围内与推荐值一致。结果表明,该合金材料是一种较好的U-Pb定年材料。因此,我们推荐这种无铅的Sn-Bi合金材料可以应用于地质样品的水丰度和U-Pb系统分析。
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Improved Pb-Free Sn-Bi Alloy Mounting Technique For Ion Probe U-Pb Analyses Of Zircon
: Zircon, a common U-rich accessory mineral occurring in terrestrial and extraterrestrial rocks, serves as a crucial tool for unraveling the temporal and geochemical clues on geologic events that have taken place on Earth and other planetary bodies. Zircon water content analysis has been advanced in the past three years via a novel sample preparation method using Sn-Bi alloy as a mounting material. Here, we present an improved Pb-free Sn-Bi alloy material for mounting samples and investigate whether the alloy mounts are suitable for in situ U-Pb dating. The secondary ion mass spectrometry (SIMS) U-Pb dating results show that the count rates of 204 Pb for zircon standards in the alloy mount are less than 0.01 cps/nA, and the calculated U-Pb and Pb-Pb ages of zircon standards are consistent with the recommended values within analytical uncertainties. Our results indicate that the alloy material used in this study is a good mounting material for U-Pb dating. Therefore, we recommend that this Pb-free Sn-Bi alloy material can be applied to mount geological samples for water abundance and U-Pb systematic analyses.
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来源期刊
Atomic Spectroscopy
Atomic Spectroscopy 物理-光谱学
CiteScore
5.30
自引率
14.70%
发文量
42
审稿时长
4.5 months
期刊介绍: The ATOMIC SPECTROSCOPY is a peer-reviewed international journal started in 1962 by Dr. Walter Slavin and now is published by Atomic Spectroscopy Press Limited (ASPL). It is intended for the rapid publication of both original articles and review articles in the fields of AAS, AFS, ICP-OES, ICP-MS, GD-MS, TIMS, SIMS, AMS, LIBS, XRF and related techniques. Manuscripts dealing with (i) instrumentation & fundamentals, (ii) methodology development & applications, and (iii) standard reference materials (SRMs) development can be submitted for publication.
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