一种基于人工智能的更可靠的面板检测缺陷检测及性能改进方法

IF 3.7 3区 工程技术 Q2 MATERIALS SCIENCE, MULTIDISCIPLINARY Journal of Information Display Pub Date : 2021-01-28 DOI:10.1080/15980316.2021.1876174
Eui-Young Jeong, Jaewon Kim, Wonhyouk Jang, Hyun-Chang Lim, Hanaul Noh, Jongmyong Choi
{"title":"一种基于人工智能的更可靠的面板检测缺陷检测及性能改进方法","authors":"Eui-Young Jeong, Jaewon Kim, Wonhyouk Jang, Hyun-Chang Lim, Hanaul Noh, Jongmyong Choi","doi":"10.1080/15980316.2021.1876174","DOIUrl":null,"url":null,"abstract":"This paper presents a practical approach to automatic inspection of display panels based on deep neural networks. The approach accurately detects appearance defects on display panels in various sizes and shapes within a short computation time. We propose a novel reliable detection network using the multi-channel parameter reduction method, which preserves high-resolution features of defects at sub-sampling steps of convolutional operations. Our proposed network consists of two sub-networks with different functions: pixel-wise segmentation of defect regions and distinction of real defects from fake defects. Compared with conventional deep learning networks, the proposed network achieved a more accurate detection rate, i.e. an F1-score of 81%, for real defect images acquired from an actual display manufacturing process. In addition, we propose a conditionally paired generative network that generates synthetic images of scarce defects under four different lighting conditions. The proposed networks improved the detection accuracy and can be applied to automatic inspection processes in display manufacturing factories in place of human inspection.","PeriodicalId":16257,"journal":{"name":"Journal of Information Display","volume":"22 1","pages":"127 - 136"},"PeriodicalIF":3.7000,"publicationDate":"2021-01-28","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1080/15980316.2021.1876174","citationCount":"5","resultStr":"{\"title\":\"A more reliable defect detection and performance improvement method for panel inspection based on artificial intelligence\",\"authors\":\"Eui-Young Jeong, Jaewon Kim, Wonhyouk Jang, Hyun-Chang Lim, Hanaul Noh, Jongmyong Choi\",\"doi\":\"10.1080/15980316.2021.1876174\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper presents a practical approach to automatic inspection of display panels based on deep neural networks. The approach accurately detects appearance defects on display panels in various sizes and shapes within a short computation time. We propose a novel reliable detection network using the multi-channel parameter reduction method, which preserves high-resolution features of defects at sub-sampling steps of convolutional operations. Our proposed network consists of two sub-networks with different functions: pixel-wise segmentation of defect regions and distinction of real defects from fake defects. Compared with conventional deep learning networks, the proposed network achieved a more accurate detection rate, i.e. an F1-score of 81%, for real defect images acquired from an actual display manufacturing process. In addition, we propose a conditionally paired generative network that generates synthetic images of scarce defects under four different lighting conditions. The proposed networks improved the detection accuracy and can be applied to automatic inspection processes in display manufacturing factories in place of human inspection.\",\"PeriodicalId\":16257,\"journal\":{\"name\":\"Journal of Information Display\",\"volume\":\"22 1\",\"pages\":\"127 - 136\"},\"PeriodicalIF\":3.7000,\"publicationDate\":\"2021-01-28\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"https://sci-hub-pdf.com/10.1080/15980316.2021.1876174\",\"citationCount\":\"5\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Journal of Information Display\",\"FirstCategoryId\":\"5\",\"ListUrlMain\":\"https://doi.org/10.1080/15980316.2021.1876174\",\"RegionNum\":3,\"RegionCategory\":\"工程技术\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q2\",\"JCRName\":\"MATERIALS SCIENCE, MULTIDISCIPLINARY\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Journal of Information Display","FirstCategoryId":"5","ListUrlMain":"https://doi.org/10.1080/15980316.2021.1876174","RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q2","JCRName":"MATERIALS SCIENCE, MULTIDISCIPLINARY","Score":null,"Total":0}
引用次数: 5

摘要

提出了一种实用的基于深度神经网络的显示面板自动检测方法。该方法可以在较短的计算时间内准确检测出各种尺寸和形状的显示面板上的外观缺陷。我们提出了一种新的可靠的检测网络,采用多通道参数约简方法,在卷积操作的子采样步骤中保留了缺陷的高分辨率特征。我们提出的网络由两个具有不同功能的子网络组成:缺陷区域的逐像素分割和真实缺陷与虚假缺陷的区分。与传统的深度学习网络相比,该网络对实际显示制造过程中获取的真实缺陷图像的检测准确率更高,f1得分为81%。此外,我们提出了一个条件配对生成网络,在四种不同的光照条件下生成稀缺缺陷的合成图像。所提出的网络提高了检测精度,可以应用于显示制造工厂的自动检测过程中代替人工检测。
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A more reliable defect detection and performance improvement method for panel inspection based on artificial intelligence
This paper presents a practical approach to automatic inspection of display panels based on deep neural networks. The approach accurately detects appearance defects on display panels in various sizes and shapes within a short computation time. We propose a novel reliable detection network using the multi-channel parameter reduction method, which preserves high-resolution features of defects at sub-sampling steps of convolutional operations. Our proposed network consists of two sub-networks with different functions: pixel-wise segmentation of defect regions and distinction of real defects from fake defects. Compared with conventional deep learning networks, the proposed network achieved a more accurate detection rate, i.e. an F1-score of 81%, for real defect images acquired from an actual display manufacturing process. In addition, we propose a conditionally paired generative network that generates synthetic images of scarce defects under four different lighting conditions. The proposed networks improved the detection accuracy and can be applied to automatic inspection processes in display manufacturing factories in place of human inspection.
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来源期刊
Journal of Information Display
Journal of Information Display MATERIALS SCIENCE, MULTIDISCIPLINARY-
CiteScore
7.10
自引率
5.40%
发文量
27
审稿时长
30 weeks
期刊最新文献
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